Laboratory testing services

Here are some examples of our most popular testing services. You can filter the options by industry or material, testing type, and device. Please contact us if you can't find the tests you are looking for.

SEM imaging

In SEM imaging, several images with varying magnifications are taken to get a good representative view of the sample surface. The resolution is higher than in traditional microscopy. Read more

ToF-ERDA measurement

Time-of-flight elastic recoil detection analysis (ToF-ERDA) can be used to measure thin films. It can provide the elemental composition of the material and can be used for depth profiling. Tof-ERDA is capable of detecting all elements and distinguishing between … Read more

SEM-EDX imaging of surfaces

Imaging of the sample using a scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX or EDS). In a typical measurement, several images are taken with varying magnifications to get a good overall view of the sample surface. Read more

XRR of thin films

X-ray reflectometry (XRR) analysis of thin film samples. Results include density (g/cm3), thickness (nm), and roughness (nm) values. For film thickness measurements, the thickness should generally be below 100 nm and at least one order of magnitude larger than the … Read more

AFM surface roughness measurement

In this analysis, the surface roughness value (RMS) of the sample is determined with atomic force microscopy (AFM). The price includes three measurement points from the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise. In … Read more

GI-XRD of thin films

Grazing Incidence X-ray diffraction (GI-XRD) measurement of thin film samples. Read more

Cross-sectional high resolution TEM-EDX imaging + FIB preparation

Cross-sectional high-resolution TEM-EDX with focused ion beam (FIB) preparation is a powerful combination of sample preparation and imaging techniques. A cross-section of the sample is prepared with a … Read more

Cross-sectional high-resolution TEM imaging + FIB preparation

The sample cross-section is prepared with a focused ion beam (FIB) and then imaged with a high-resolution transmission electron microscope (HR-TEM). The resulting image resolution is very high, … Read more

Can’t find what you’re looking for?

Only a fraction of our services are listed on the website. Contact us to get access to all services.

TEM imaging

Imaging of the sample with transmission electron microscope (TEM). In typical measurement, several images with varying magnifications are taken to get a good overall view of the sample. Read more

XRR + GI-XRD of thin films

Grazing Incidence X-ray diffraction (GI-XRD) measurement of thin films + X-ray reflectometry (XRR) analysis of thin films. Results include density (g/cm3), thickness (nm), and roughness (nm) values. For XRR, the thickness should generally be below 100 nm and … Read more

Particle size distribution with SEM

Particle size distribution (PSD) is determined from scanning electron microscope (SEM) images of around 300 particles. Depending on the particle shapes, the method includes calculations on the diameters or lengths and widths of the particles. In … Read more

VPD ICP-MS

VPD ICP-MS allows the determination of trace metal contamination on the surface of bare silicon wafers and thin films. The full surface of the wafer is scanned during the analysis. VPD ICP-MS analysis is performed using acid to dissolve the top surface of the wafer. The standard … Read more

X-ray photoelectron spectroscopy (XPS)

XPS is a semi-quantitative technique that allows the measurement of the elemental composition of the surface of materials. In addition, it can also determine the binding and electronic state of the atoms. XPS is a surface-sensitive technique. … Read more

Contact angle determination

Determination of a solid surface's contact angle with one liquid. Practically any liquid can be used as long as the liquid does not affect the surface and the surface tension of the liquid is known. The price for the first batch of 3 samples is 530€, and … Read more

Cross-section SEM imaging + Broad Ion Beam (BIB) preparation

The analysis includes the preparation of a cross-section sample using Broad Ion Beam (BIB). After preparation, the cross-section surface is imaged with a Scanning Electron Microscope (SEM). Read more

Ellipsometry measurement

Ellipsometry is an optical technique that characterizes polarized light reflected from a sample's surface. The thickness or the refractive index of the layer can be measured with this technique. This ellipsometry measurement is used to characterize thin films … Read more

Secondary ion mass spectrometry (SIMS)

Secondary ion mass spectrometry (SIMS) is a depth profiling method that can be used for a wide variety of solid materials to determine impurities or dopants. All elements from hydrogen to uranium can be detected. Standards are needed to get … Read more

Specific surface area + pore size analysis

N2 adsorption analysis to determine specific surface area and pore size of solid materials. Read more

TEM-EDX imaging

Imaging of the sample with transmission electron microscopy (TEM) and determination of the elemental composition of the sample using electron dispersive X-ray spectroscopy (EDX or EDS). Several images with varying magnifications are taken to get a good overall view of the … Read more

AFM surface imaging

During this analysis, the surface of a smooth and hard sample is imaged with an atomic force microscope (AFM). Topological images are provided from several locations around the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise. Read more

Cross-section SEM imaging + Focused Ion Beam (FIB) preparation

The analysis includes the preparation of a cross-section sample using a Focused Ion Beam (FIB) and the imaging of the cross-section surface with a Scanning Electron Microscope (SEM). Read more

Cross-section SEM imaging + freeze fracturing preparation

A cross-section sample is prepared using freeze fracturing: the sample is frozen in liquid nitrogen (-195 C°), followed by cracking. The cracked surface is then imaged with a scanning electron microscope (SEM). … Read more

Nano scratch test

Nano Scratch Test of thin film samples. Typical measurement includes overview image of the scratch track (surface damage) and determination of critical load values. Read more

Cross-section SEM-EDX imaging + Broad Ion Beam (BIB) preparation

The analysis includes the preparation of a cross-section sample using Broad Ion Beam (BIB). After preparation, the cross-section is imaged with a scanning electron microscope (SEM), and elemental … Read more

SEM screening of surfaces

In this analysis, a large area of a sample is screened with a scanning electron microscope (SEM) to find an area of interest containing cracks or impurities. Such areas are likely to be found in a few locations around the sample and might be challenging to … Read more

ToF-SIMS measurement

Time of flight - secondary ion mass spectrometry (ToF-SIMS) is an analytical technique that provides information about the extreme surfaces of solid materials. It can be used for elemental and molecular analysis as well as surface mapping. It can also be used as a … Read more

XPS peak deconvolution - binding state of atoms

XPS is a semi-quantitative technique allowing to measure the elemental composition of the surface of materials. In addition, it can also determine the binding state of the atoms. If you wish to perform this test, please ask the … Read more

Broad Ion Beam (BIB) cut

Preparation of a cross-section sample using Broad Ion Beam (BIB). Read more

Grease resistance of paper or board with palm oil method

TAPPI 454
The grease resistance of paper and board is determined by establishing the time taken for a simulated “fat material” (palm kernel oil) to penetrate (break through) the sheet of paper or board. … Read more

Grease resistance of paper or board with the KIT test

TAPPI 559
This test follows the TAPPI Test Method T559. It assesses how fluorochemicals, or other surface treatment chemicals, which can make paper both resistant to oil (organophobic) and water (hydrophobic), … Read more

ISO brightness of paper or paperboard

ISO 2470-1
The method measures the diffuse blue light reflectance factor of paper and board by the ISO 2470-1 standard. The test is limited to white and near-white samples. The measurement is used to determine the whiteness level of … Read more

Opacity of paper or board

ISO 2471
This method is used to determine the opacity (paper backing) of paper by diffuse reflectance. The test is suitable for papers and boards that contain fluorescent whitening agents, as long as the UV content of the radiation incident on the test … Read more

Optical profilometry

Measurement of roughness or edge sharpness by optical profilometry. Read more

RBS measurement (express delivery)

Determination of the elemental composition (ratio of the elements) using RBS (Rutherford Backscattering Spectrometry). Also, depth profiles of the sample surfaces can be determined using RBS. The method is suitable for e.g. thin films, coatings, … Read more

RBS measurement (normal delivery)

Determination of the elemental composition (ratio of the elements) using RBS (Rutherford Backscattering Spectrometry). Also, depth profiles of the sample surfaces can be determined using RBS. The method is suitable for e.g. thin films, coatings, and … Read more

Roughness of paper or board

Multiple methods to determine paper's or board's roughness exist. The most typical tests are: - The Bendtsen method (ISO 8791-2) - For papers and boards that have a Bendtsen value between 5 and 3000 ml/min. Not suitable for papers with high air permeability. … Read more

Surface energy determination

Surface energy determination using contact angle measurements. Read more

BPSG analysis

Determination of B and P in Borophosphosilicate glass. Read more

LA-ICP-MS of thin film samples (70 elements)

Determination of metal concentrations on ALD thin films using LA-ICP-MS. The measurement includes the analysis of the following elements: Ag, Al, As, Au, B, Ba, Be, Bi, Br, Ca, Cd, Ce, Co, Cr, Cs, Cu, Dy, Er, Eu Fe, Ga, Gd, Ge, Hf, … Read more

LA-ICP-MS of thin film samples (standard elements)

Determination of metal concentrations on ALD thin films using LA-ICP-MS. The standard analysis package includes the quantification of the following elements: Ca, Cr, Cu, Co, Er, Fe, Ge, Pb, Mn, Mo, Ni, K, Na, Sn, Ti, Ta, Zn, … Read more

CIE whiteness of paper or paperboard

The CIE whiteness test measures the whiteness of paper or board under the CIE D65 daylight standard. The method gives the complete visible spectral range (VIS) information about whiteness, unlike the ISO ( ISO 2470 ) method, which operates only … Read more

Coefficient of friction of plastic films

ISO 8295/4
The method measures the coefficients of starting and sliding friction of plastic films and sheeting when sliding over the same or another material. The testing procedure is based on the ISO 8295 standard. The … Read more

Color of paper or board

ISO 5631-1, ISO 5631-2
This test is used to measure the color of paper and board by the diffuse reflectance method with spectral gloss elimination as outlined in standards ISO 5631-1 and ISO 5631-2. The method is not suitable for papers that … Read more

Fabric electrostatic properties – surface resistivity

EN 1149-1
Surface resistivity testing of clothing or gloves. Standardised test method for protective clothing with electrostatic dissipation for preventing incendiary discharge. Read more

Gloss of paper or board

EN ISO 8254-1
This method provides the measurement of the specular gloss of paper at an angle of 75° to the normal of the paper surface. Although its chief application is for coated papers, the test may also be used for glossy uncoated papers such as … Read more

Grease resistance of paper or board with the turpentine method

TAPPI 454
This test determines the penetration of greases and oil, commonly found in foodstuffs. The test can be used to evaluate and grade the usability of greaseproof papers and vegetable … Read more

LA-ICP-MS of thin film samples (one element)

Determination of a metal concentration on an ALD thin film using LA-ICP-MS. The measurement includes the analysis of one element, which is selected upon odering. Values will be reported in ppm (μg/g). Read more

Photochromism of textiles

EN ISO 105-B05
This test determines the color resistance of textiles designed to change color (photochromatic textiles) upon brief exposure to light. Read more

Smoothness of paper with the Bekk method

ISO 5627
The smoothness of a paper or board sample is determined with the Bekk method. This test is recommended especially for smooth grades and is not recommended for samples over 0.5 mm thick or very permeable papers. The results … Read more

Yellowness of paper or board

DIN 6167
The influence of temperature, chemical reactions, radiation, etc. can make white or colorless materials such as art equipment, paper, and paints yellow. The yellowness number indicates the change in the yellow value of a sample due to one … Read more

Type of testing

Industry or material

Ask for an offer

Fill in the form, and we'll reply in one business day.

Answering the following questions helps us prepare an offer for you faster:

  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.