Laboratory testing services

Here are some examples of our most popular testing services. You can filter the options by industry or material, testing type, and device. Please contact us if you can't find the tests you are looking for.

ToF-ERDA measurement (Normal delivery)

Time-of-Flight Elastic Recoil Detection Analysis (ToF-ERDA) can be used to measure the composition of solid samples quantitatively. It can be used for depth profiling. Tof-ERDA is capable of detecting all elements and distinguishing between …

SEM imaging

In SEM imaging, several images with varying magnifications are taken to get a good representative view of the sample surface. The resolution is higher than in traditional microscopy.

SEM-EDX imaging of surfaces

Imaging of the sample using a scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX or EDS). In a typical measurement, several images are taken with varying magnifications to get a good overall view of the sample surface.

XRR of thin films or coatings

X-Ray Reflectometry (XRR) analysis is used to measure the density, thickness, and roughness of films. For film thickness measurements, the thickness should generally be below 300 nm (depending on the material) and the roughness should be low (<5 nm). If …

AFM surface roughness measurement

In this analysis, the surface roughness value (RMS) of the sample is determined with atomic force microscopy (AFM). The price includes three measurement points from the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise. In …

GI-XRD of thin films

Grazing Incidence X-ray diffraction (GI-XRD) measurement of thin film samples.

Specific surface area (BET)

BET (Brunauer–Emmett–Teller) analysis to determine specific surface area and pore size of solid materials.

Cross-sectional high-resolution TEM imaging + FIB preparation

The sample cross-section is prepared with a focused ion beam (FIB) and then imaged with a high-resolution transmission electron microscope (HR-TEM). The resulting image resolution is very high, …

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Cross-sectional high resolution TEM-EDX imaging + FIB preparation

Cross-sectional high-resolution TEM-EDX with focused ion beam (FIB) preparation is a powerful combination of sample preparation and imaging techniques. A cross-section of the sample is prepared with a …

Ellipsometry measurement

Ellipsometry is an optical technique that characterizes polarized light reflected from a sample's surface. The thickness or the refractive index of the layer can be measured with this technique. This ellipsometry measurement is used to characterize thin films or …

XRR + GI-XRD of thin films

Grazing Incidence X-ray diffraction (GI-XRD) measurement of thin films + X-ray reflectometry (XRR) analysis of thin films. Results include density (g/cm3), thickness (nm), and roughness (nm) values. For XRR, the thickness should generally be below 100 nm and …

ICP-MS for thin films on wafers

Determination of trace metal contamination in thin films on silicon wafers. Different methods can be used depending on the material and substrate. Please, contact our expert to discuss the feasibility of the measurement for your matrix.

TEM imaging

Imaging of the sample with transmission electron microscope (TEM). In typical measurement, several images with varying magnifications are taken to get a good overall view of the sample.

Specific surface area + pore size analysis

N2 adsorption analysis to determine specific surface area and pore size of solid materials.

TEM-EDX imaging

Imaging of the sample with transmission electron microscopy (TEM) and determination of the elemental composition of the sample using electron dispersive X-ray spectroscopy (EDX or EDS). Several images with varying magnifications are taken to get a good overall view of the …

VPD ICP-MS

VPD ICP-MS allows the determination of trace metal contamination on the surface of bare silicon wafers and thin films. The full surface of the wafer is scanned during the analysis. VPD ICP-MS analysis is performed using acid to dissolve the top surface of the wafer. The standard …

X-ray photoelectron spectroscopy (XPS)

XPS is a semi-quantitative technique that allows the measurement of the elemental composition of the surface of materials. In addition, it can also determine the binding and electronic state of the atoms. XPS is a surface-sensitive technique. …

Cross-section SEM imaging + Broad Ion Beam (BIB) preparation

The analysis includes the preparation of a cross-section sample using Broad Ion Beam (BIB). After preparation, the cross-section surface is imaged with a Scanning Electron Microscope (SEM).

Contact angle determination

Determination of a solid surface's contact angle with liquids. The price includes three analyses. Practically any liquid can be used as long as the liquid does not affect the surface and the surface tension of the liquid is known.

AFM surface imaging

During this analysis, the surface of a smooth and hard sample is imaged with an atomic force microscope (AFM). Topological images are provided from several locations around the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise.

Grease resistance of paper or board with the KIT test

TAPPI 559
This test follows the TAPPI Test Method T559. It assesses how fluorochemicals, or other surface treatment chemicals, which can make paper both resistant to oil (organophobic) and water (hydrophobic), …

XPS peak deconvolution - binding state of atoms

XPS is a semi-quantitative technique allowing to measure the elemental composition of the surface of materials. In addition, it can also determine the binding state of the atoms. If you wish to perform this test, please ask the …

Cross-section SEM imaging + Focused Ion Beam (FIB) preparation

The analysis includes the preparation of a cross-section sample using a Focused Ion Beam (FIB) and the imaging of the cross-section surface with a Scanning Electron Microscope (SEM).

Cross-section SEM imaging + freeze fracturing preparation

A cross-section sample is prepared using freeze fracturing: the sample is frozen in liquid nitrogen (-195 C°), followed by cracking. The cracked surface is then imaged with a scanning electron microscope (SEM). …

Nano scratch test

Nano Scratch Test of thin film samples. Typical measurement includes overview image of the scratch track (surface damage) and determination of critical load values.

ToF-SIMS measurement

Time of flight - secondary ion mass spectrometry (ToF-SIMS) is an analytical technique that provides information about the extreme surfaces of solid materials. It can be used for elemental and molecular analysis as well as surface mapping. It can also be used as a …

Cross-section SEM-EDX imaging + Broad Ion Beam (BIB) preparation

The analysis includes the preparation of a cross-section sample using Broad Ion Beam (BIB). After preparation, the cross-section is imaged with a scanning electron microscope (SEM), and elemental …

ISO brightness of paper or paperboard

ISO 2470-1
The method measures the diffuse blue light reflectance factor of paper and board by the ISO 2470-1 standard. The test is limited to white and near-white samples. The measurement is used to determine the whiteness level of …

SEM screening for wide surfaces

In this analysis, the sample is screened with a scanning electron microscope (SEM) to find an area of interest (for example cracks or impurities). In a typical SEM screening, 3 areas are images with varying magnifications to get a good overview of the …

Broad Ion Beam (BIB) cut

Preparation of a cross-section sample using Broad Ion Beam (BIB).

Grease resistance of paper or board with palm oil method

TAPPI 454
The grease resistance of paper and board is determined by establishing the time taken for a simulated “fat material” (palm kernel oil) to penetrate (break through) the sheet of paper or board. …

Opacity of paper or board

ISO 2471
This method is used to determine the opacity (paper backing) of paper by diffuse reflectance. The test is suitable for papers and boards that contain fluorescent whitening agents, as long as the UV content of the radiation incident on the test …

Optical profilometry

Measurement of roughness or edge sharpness by optical profilometry.

Powder XRD measurement - Qualitative analysis

Qualitative or comparative analysis of crystalline powders using X-ray diffraction (XRD). The analysis is only suitable for materials with at least one crystalline phase.

RBS measurement (Fast delivery)

Rutherford Backscattering Spectrometry (RBS) can be used to measure the composition of solid samples quantitatively. The method can be used for depth profiling. RBS is used for the analysis of heavier elements and can be combined with ToF-ERDA when …

RBS measurement (Normal delivery)

Rutherford Backscattering Spectrometry (RBS) can be used to measure the composition of solid samples quantitatively and can be used for depth profiling. RBS is used for the analysis of heavier elements and can be combined with ToF-ERDA when lighter …

Roughness of paper or board

Multiple methods to determine paper's or board's roughness exist. The most typical tests are: - The Bendtsen method (ISO 8791-2) - For papers and boards that have a Bendtsen value between 5 and 3000 ml/min. Not suitable for papers with high air permeability. …

Surface energy determination

Surface energy determination using contact angle measurements.

BPSG analysis

Determination of B and P in Borophosphosilicate glass.

Group delay dispersion (GDD) and group velocity dispersion (GVD)

Group delay dispersion (GDD) and group velocity dispersion (GVD) are critical parameters for understanding how the propagation time and speed of light pulses change with frequency or wavelength as they …

LA-ICP-MS of thin film samples (70 elements)

Determination of metal concentrations on ALD thin films using LA-ICP-MS. The measurement includes the analysis of the following elements: Ag, Al, As, Au, B, Ba, Be, Bi, Br, Ca, Cd, Ce, Co, Cr, Cs, Cu, Dy, Er, Eu Fe, Ga, Gd, Ge, Hf, …

LA-ICP-MS of thin film samples (standard elements)

Determination of metal concentrations on ALD thin films using LA-ICP-MS. The standard analysis package includes the quantification of the following elements: Ca, Cr, Cu, Co, Er, Fe, Ge, Pb, Mn, Mo, Ni, K, Na, Sn, Ti, Ta, Zn, …

CIE whiteness of paper or paperboard

The CIE whiteness test measures the whiteness of paper or board under the CIE D65 daylight standard. The method gives the complete visible spectral range (VIS) information about whiteness, unlike the ISO ( ISO 2470 ) method, which operates only …

Coefficient of friction of plastic films

ISO 8295/4
The method measures the coefficients of starting and sliding friction of plastic films and sheeting when sliding over the same or another material. The testing procedure is based on the ISO 8295 standard. The …

Color of paper or board

ISO 5631-1, ISO 5631-2
This test is used to measure the color of paper and board by the diffuse reflectance method with spectral gloss elimination as outlined in standards ISO 5631-1 and ISO 5631-2. The method is not suitable for papers that …

Fabric electrostatic properties – surface resistivity

EN 1149-1
Surface resistivity testing of clothing or gloves. Standardised test method for protective clothing with electrostatic dissipation for preventing incendiary discharge.

Gloss of paper or board

EN ISO 8254-1
This method provides the measurement of the specular gloss of paper at an angle of 75° to the normal of the paper surface. Although its chief application is for coated papers, the test may also be used for glossy uncoated papers such as …

Grease resistance of paper or board with the turpentine method

TAPPI 454
This test determines the penetration of greases and oil, commonly found in foodstuffs. The test can be used to evaluate and grade the usability of greaseproof papers and vegetable …

LA-ICP-MS of thin film samples (one element)

Determination of a metal concentration on an ALD thin film using LA-ICP-MS. The measurement includes the analysis of one element, which is selected upon odering. Values will be reported in ppm (μg/g).

Si wafer organic contamination by ATD GC-MS

SEMI MF 1982-1103
Automated thermal desorption gas chromatography-mass spectrometry (ATD-GC-MS) is a very sensitive method for wafer surface organic contamination analysis, providing low detection limits and a wide …

Smoothness of paper with the Bekk method

ISO 5627
The smoothness of a paper or board sample is determined with the Bekk method. This test is recommended especially for smooth grades and is not recommended for samples over 0.5 mm thick or very permeable papers. The results …

ToF-ERDA measurement (Priority option)

Time-of-Flight Elastic Recoil Detection Analysis (ToF-ERDA) can be used to measure the composition of solid samples quantitatively. It can be used for depth profiling. Tof-ERDA is capable of detecting all elements and distinguishing between …

Yellowness of paper or board

DIN 6167
The influence of temperature, chemical reactions, radiation, etc. can make white or colorless materials such as art equipment, paper, and paints yellow. The yellowness number indicates the change in the yellow value of a sample due to one …

Type of testing

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