TEM-EDX imaging

Imaging of the sample with transmission electron microscopy (TEM) and determination of the elemental composition of the sample using electron dispersive X-ray spectroscopy (EDX or EDS).

Several images with varying magnifications are taken to get a good overview of the sample. An EDX mapping, line scan, or point measurement is collected to measure the sample composition (elemental at.% or wt.%).

For solid samples, it often requires FIB preparation which is not included in the price.

HR-TEM can also be provided. Contact us for more details.

Don't hesitate to ask for more information from our expert.

Suitable sample matrices
Dry, solid material, powder, thin film or coating
Required sample quantity
1x1 cm or 1 g
Typical turnaround time
3 weeks after receiving the samples
Detection limit
- nm
Available quality systems
Measurlabs validated method
Device types

Pricing and online order

Price per sample (Excl. VAT):
1,025 €

We also charge a 97 € service fee per order.

Large batches of samples are eligible for discounts.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Questions? We're happy to help.

Questions? We're happy to help.

Ringing phone
...and more than 700 other happy clients

Ask for an offer

Fill in the form, and we'll reply in one business day.

Answering the following questions helps us prepare an offer for you faster:

  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.