Focused Ion Beam (FIB) preparation
Focused Ion Beam (FIB) preparation is performed on the sample.
It allows to cut samples very precisely in order to observe them by TEM or SEM imaging.
The price includes only the FIB preparation.
More information about the method:
Focused ion beam (FIB)- Suitable sample matrices
- Dry materials: solid films, solid pieces, thin films
- Typical turnaround time
- 2 weeks after receiving the samples
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
Polymers and plastics
Semiconductors
Microscopy
Surface testingPrice
Price per sample (Excl. VAT):
800 €
We also charge a 97 € service fee per order.
Large batches of samples are eligible for discounts.
Questions? We're happy to help.
Questions? We're happy to help.
Ask for an offer
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Have questions or need help? Email us at info@measurlabs.com or call our sales team.