XRR of thin films
Material testing
Surface testingX-ray reflectometry (XRR) analysis of thin film samples. Results include density (g / cm3), thickness (nm), and roughness (nm) values. For the film thickness measurements, the film thickness has to be below 100 nm and it has to be at least one order of magnitude larger than the roughness. For density and surface roughness measurements, film thickness can be < 100 nm or > 100 nm.
More information about the method family:
X-ray reflectivity (XRR)- Suitable sample matrices
- Thin films, ALD samples
- Minimum sample amount
- Optimal 5 x 4 cm, minimum 2 x 2 cm
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device families
- Method expert
- Price (VAT 0)
- First sample: 613 €
Additional samples: 208 € per sample
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1.Order one of our testing services or ask for help.
2.Send us your samples.
3.We measure your materials or products.
4.You receive the test report and the results in your email.