SEM-EDX imaging

Imaging of the sample using a scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX or EDS).

Typically, several images are taken with varying magnifications to get a good overview of the sample. An EDX mapping, line scan, or point measurement is collected to measure the sample composition (elemental at.% or wt.%).

The sample can be prepared with a metallic coating for non-conductive samples.

For cross-section measurement, an additional preparation not included in the price might be needed: FIB, BIB or freeze fracturing.