SEM-EDX imaging of surfaces
Imaging of the sample using scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX, EDS) . In a typical measurement, several images with varying magnifications are taken to get a good overall view of the sample surface.
More information about the method family:SEM-EDX Analysis (SEM-EDX)
- Suitable sample matrices
- Dry, solid materials
- Minimum sample amount
- A few milligrams of the material is typically enough.
- Typical turnaround time
- 3 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device families
- Method expert
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