SEM-EDX imaging of surfaces
Imaging of the sample using a scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX or EDS).
In a typical measurement, several images are taken with varying magnifications to get a good overall view of the sample surface.
More information about the method family:
SEM-EDX Analysis (SEM-EDX)Scanning electron microscopy (SEM)- Suitable sample matrices
- Dry, solid materials
- Required sample quantity
- A few milligrams of the material are typically enough.
- Typical turnaround time
- 3 weeks after receiving the samples
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
Chemicals
Polymers and plastics
Semiconductors
Microscopy
Particle testing
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