SEM-EDX imaging of surfaces
Imaging of the sample using a scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX or EDS). In a typical measurement, several images are taken with varying magnifications to get a good overall view of the sample surface.
More information about the method family:
Scanning electron microscopy (SEM)SEM-EDX Analysis (SEM-EDX)
Chemicals
Polymers and plastics
Semiconductors
Microscopy
Particle testing
Surface testing- Suitable sample matrices
- Dry, solid materials
- Minimum sample amount
- A few milligrams of the material are typically enough.
- Typical turnaround time
- 3 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device families
- Method expert
Questions? We're happy to help.
Questions? We're happy to help.
Results in four easy steps
1
Select the tests you need
2
Get an order confirmation
3
Ship your samples to us
4
Receive your test report