SEM-EDX imaging of surfaces
Imaging of the sample using scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX, EDS) . In a typical measurement, several images with varying magnifications are taken to get a good overall view of the sample surface.
More information about the method family:
SEM-EDX Analysis (SEM-EDX)
Compositional analysis
Electron microscopy
Microscopy
Spectroscopy
Surface testing
X-ray methods- Suitable sample matrices
- Dry, solid materials
- Minimum sample amount
- A few milligrams of the material is typically enough.
- Typical turnaround time
- 3 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device families
- Method expert
Interested in this measurement?
You can order this measurement via online checkout. Just fill in a few details below:
Questions? We're happy to help.
Questions? We're happy to help.
Results in four easy steps
1
Select the tests you need
2
Get an order confirmation
3
Ship your samples to us
4
Receive your test report