SEM imaging

Imaging of the sample using scanning electron microscopy (SEM).

Typically, several images are taken with varying magnifications to get a good overview of the sample.

Non-conductive samples can be prepared with a metallic coating to allow imaging.

For cross-section measurement, additional preparation might be needed: FIB, BIB or freeze fracturing.

If compositional analysis is also needed, please see the SEM-EDX measurement.