AFM surface imaging
Imaging of the sample with atomic force microscope (AFM). In typical measurement, topological images are provided from several locations. Measurement area 5 x 5 micrometers if not otherwise agreed.
More information about the method family:
Atomic force microscopy (AFM)- Suitable sample matrices
- Smooth, hard surfaces, such as silicon wafers or glass.
- Minimum sample amount
- 1 x 1 cm
- Typical turnaround time
- 4 weeks after receiving the samples
- Detection limit
- 0.1 nm
- Quality system
- Measurlabs validated method
- Device families
- Method expert
- Price (VAT 0)
- First sample: 354 €
Additional samples: 162 € per sample
Interested in this measurement?
You can order this measurement via online checkout. Just fill in a few details below:
Questions? We're happy to help.
Questions? We're happy to help.
Ordering made easy
1.Order one of our testing services or ask for help.
2.Send us your samples.
3.We measure your materials or products.
4.You receive the test report and the results in your email.