AFM surface imaging
During this analysis, the surface of a smooth and hard sample is imaged with an atomic force microscope (AFM).
Topological images are provided from several locations around the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise.
More information about the method family:
Atomic Force Microscopy (AFM)- Suitable sample matrices
- Smooth, hard surfaces, such as silicon wafers or glass.
- Minimum sample amount
- 1 x 1 cm
- Typical turnaround time
- 4 weeks after receiving the samples
- Detection limit
- 0.1 nm
- Quality system
- Measurlabs validated method
- Device types
- Method expert
![Kia Bertula]()
Kia Bertula
Semiconductors
Microscopy
Surface testingQuestions? We're happy to help.
Questions? We're happy to help.
Results in four easy steps
1
Select the tests you need
2
Get an order confirmation
3
Ship your samples to us
4
Receive your test report