AFM surface imaging

During this analysis, the surface of a smooth and hard sample is imaged with an atomic force microscope (AFM). Topological images are provided from several locations around the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise.

SemiconductorsMicroscopySurface testing

Suitable sample matrices

Smooth, hard surfaces, such as silicon wafers or glass.

Minimum sample amount

1 x 1 cm

Typical turnaround time

4 weeks after receiving the samples

Detection limit

0.1 nm

Quality system

Measurlabs validated method

Device families

AFM

Method expert

Kia Bertula