AFM surface imaging

During this analysis, the surface of a smooth and hard sample is imaged with an atomic force microscope (AFM).

Topological images are provided from several locations around the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise.

Suitable sample matrices
Smooth, hard surfaces, such as silicon wafers or glass.
Minimum sample amount
1 x 1 cm
Typical turnaround time
4 weeks after receiving the samples
Detection limit
0.1 nm
Quality system
Measurlabs validated method
Device types
Method expert
Kia Bertula

Order this test online

First sample (VAT 0):
396 €
Additional samples (VAT 0):
181 €per sample
If you have a large number of samples, contact us for a possible discount.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Questions? We're happy to help.

Questions? We're happy to help.

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