AFM surface imaging
Imaging of the sample with atomic force microscope (AFM). In typical measurement, topological images are provided from several locations. Measurement area 5 x 5 micrometers if not otherwise agreed.
More information about the method family:
AFM Analysis (AFM)
Material testing
Surface testing- Suitable sample matrices
- Smooth, hard surfaces, such as silicon wafers or glass.
- Minimum sample amount
- 1 x 1 cm
- Typical turnaround time
- 4 weeks after receiving the samples
- Detection limit
- 0.1 nm
- Quality system
- Measurlabs validated method
- Device families
- Method expert
Interested in this measurement?
You can order this measurement via online checkout. Just fill in a few details below:
Questions? We're happy to help.
Questions? We're happy to help.
Results in four easy steps
1
Select the tests you need
2
Get an order confirmation
3
Ship your samples to us
4
Receive your test report