AFM surface imaging

During this analysis, the surface of a smooth and hard sample is imaged with an atomic force microscope (AFM).

Topological images are provided from several locations around the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise.

Suitable sample matrices
Smooth, hard surfaces, such as silicon wafers or glass.
Required sample quantity
1 x 1 cm
Typical turnaround time
3 weeks after receiving the samples
Detection limit
0.1 nm
Available quality systems
Measurlabs validated method
Device types
Method expert
Kamal Mundoli
Kamal Mundoli

Pricing and online order

Price per sample (Excl. VAT):
330 €

We also charge a 97 € service fee per order.

Large batches of samples are eligible for discounts.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Questions? We're happy to help.

Questions? We're happy to help.

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Ask for an offer

Fill in the form, and we'll reply in one business day.

Answering the following questions helps us prepare an offer for you faster:

  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.