AFM surface imaging

Imaging of the sample with atomic force microscope (AFM). In typical measurement, topological images are provided from several locations. Measurement area 5 x 5 micrometers if not otherwise agreed.

Suitable sample matrices
Smooth, hard surfaces, such as silicon wafers or glass.
Minimum sample amount
1 x 1 cm
Typical turnaround time
4 weeks after receiving the samples
Detection limit
0.1 nm
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula

Interested in this measurement?

You can order this measurement via online checkout. Just fill in a few details below:

396 €
First sample: 396 €
Additional samples: 181 € per sample

Questions? We're happy to help.

Questions? We're happy to help.

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Results in four easy steps

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1
Select the tests you need
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2
Get an order confirmation
Sample shipping package
3
Ship your samples to us
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4
Receive your test report