AFM surface imaging

Material testingMaterial testing
Surface testingSurface testing

Imaging of the sample with atomic force microscope (AFM). In typical measurement, topological images are provided from several locations. Measurement area 5 x 5 micrometers if not otherwise agreed.

Suitable sample matrices
Smooth, hard surfaces, such as silicon wafers or glass.
Minimum sample amount
1 x 1 cm
Typical turnaround time
3 weeks after receiving the samples
Detection limit
0.1 nm
Quality system
Measurlabs validated method
Device families
AFM
Method expert

Price

First sample

354

per sample

Additional samples

162

per sample

Prices excluding VAT.

Ordering made easy

Person on a computer
1.Order one of our testing services or ask for help.
Delivery package
2.Send us your samples.
Laboratory technician conducting measurements
3.We measure your materials or products.
Report inside an envelope
4.You receive the test report and the results in your email.

Ask for a quote

Contact us below to get a quote for testing services in one business day.

We are currently only able to serve companies and other organizations.

You can also email us at info@measurlabs.com or call us at +358 40 735 4843.

We always reply within one business day.