AFM surface imaging
Imaging of the sample with atomic force microscope (AFM). In typical measurement, topological images are provided from several locations. Measurement area 5 x 5 micrometers if not otherwise agreed.
More information about the method family:AFM Analysis (AFM)
- Suitable sample matrices
- Smooth, hard surfaces, such as silicon wafers or glass.
- Minimum sample amount
- 1 x 1 cm
- Typical turnaround time
- 4 weeks after receiving the samples
- Detection limit
- 0.1 nm
- Quality system
- Measurlabs validated method
- Device families
- Method expert
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