AFM surface imaging

Imaging of the sample with atomic force microscope (AFM). In typical measurement, topological images are provided from several locations. Measurement area 5 x 5 micrometers if not otherwise agreed.

Suitable sample matrices
Smooth, hard surfaces, such as silicon wafers or glass.
Minimum sample amount
1 x 1 cm
Typical turnaround time
4 weeks after receiving the samples
Detection limit
0.1 nm
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula
Price (VAT 0)
First sample: 354 €
Additional samples: 162 € per sample

Interested in this measurement?

You can order this measurement via online checkout. Just fill in a few details below:

354 €(VAT 0)

Questions? We're happy to help.

Questions? We're happy to help.

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1.Order one of our testing services or ask for help.
Delivery package
2.Send us your samples.
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3.We measure your materials or products.
Report inside an envelope
4.You receive the test report and the results in your email.