AFM surface imaging

During this analysis, the surface of a smooth and hard sample is imaged with an atomic force microscope (AFM).

Topological images are provided from several locations around the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise.

Suitable sample matrices
Smooth, hard surfaces, such as silicon wafers or glass.
Required sample quantity
1 x 1 cm
Typical turnaround time
3 weeks after receiving the samples
Detection limit
0.1 nm
Quality system
Measurlabs validated method
Device types
Method expert
Hande Güneş

Order this test online

First sample (VAT 0):
425 €
Additional samples (VAT 0):
310 €per sample
If you have a large number of samples, contact us for a possible discount.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Large number of samples or specialized needs?

Questions? We're happy to help.

Questions? We're happy to help.

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Ask for an offer

Fill in the form, and we'll reply in one business day.

Answering the following questions helps us prepare an offer for you faster:

  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.