AFM surface roughness measurement

Measuring the surface roughness value (RMS value) of the sample using atomic force microscopy (AFM). Includes also a 2D image, 3D image and raw data. The price includes three measurement points from the sample. Measurement area 5 x 5 micrometers if not otherwise agreed.

Suitable sample matrices
Smooth, hard surfaces, such as silicon wafers or glass.
Minimum sample amount
1 x 1 cm
Typical turnaround time
4 weeks after receiving the samples
Detection limit
0.1 nm
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula
Price (VAT 0)
First sample: 588 €
Additional samples: 425 € per sample

Interested in this measurement?

You can order this measurement via online checkout. Just fill in a few details below:

588 €(VAT 0)

Questions? We're happy to help.

Questions? We're happy to help.

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Ordering made easy

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1.Order one of our testing services or ask for help.
Delivery package
2.Send us your samples.
Laboratory technician conducting measurements
3.We measure your materials or products.
Report inside an envelope
4.You receive the test report and the results in your email.