AFM surface roughness measurement
Measuring the surface roughness value (RMS value) of the sample using atomic force microscopy (AFM). Includes also a 2D image, 3D image and raw data. The price includes three measurement points from the sample. Measurement area 5 x 5 micrometers if not otherwise agreed.
More information about the method family:Atomic force microscopy (AFM)
- Suitable sample matrices
- Smooth, hard surfaces, such as silicon wafers or glass.
- Minimum sample amount
- 1 x 1 cm
- Typical turnaround time
- 4 weeks after receiving the samples
- Detection limit
- 0.1 nm
- Quality system
- Measurlabs validated method
- Device families
- Method expert
- Price (VAT 0)
- First sample: 588 €
Additional samples: 425 € per sample
Interested in this measurement?
You can order this measurement via online checkout. Just fill in a few details below: