AFM surface roughness measurement
Material testing
Surface testingMeasuring the surface roughness value (RMS value) of the sample using atomic force microscopy (AFM). Includes also a 2D image, 3D image and raw data. The price includes three measurement points from the sample. Measurement area 5 x 5 micrometers if not otherwise agreed.
More information about the method family:
Atomic force microscopy (AFM)- Suitable sample matrices
- Smooth, hard surfaces, such as silicon wafers or glass.
- Minimum sample amount
- 1 x 1 cm
- Typical turnaround time
- 4 weeks after receiving the samples
- Detection limit
- 0.1 nm
- Quality system
- Measurlabs validated method
- Device families
- Method expert
- Price (VAT 0)
- First sample: 588 €
Additional samples: 425 € per sample
Interested in this measurement?
You can order this measurement via online checkout. Just fill in a few details below:
Questions? We're happy to help.
Questions? We're happy to help.
Ordering made easy
1.Order one of our testing services or ask for help.
2.Send us your samples.
3.We measure your materials or products.
4.You receive the test report and the results in your email.