AFM surface roughness measurement

Measuring the surface roughness value (RMS value) of the sample using atomic force microscopy (AFM). Includes also a 2D image, 3D image and raw data. The price includes three measurement points from the sample. Measurement area 5 x 5 micrometers if not otherwise agreed.

Suitable sample matrices
Smooth, hard surfaces, such as silicon wafers or glass.
Minimum sample amount
1 x 1 cm
Typical turnaround time
4 weeks after receiving the samples
Detection limit
0.1 nm
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula

Interested in this measurement?

You can order this measurement via online checkout. Just fill in a few details below:

598 €
First sample: 598 €
Additional samples: 476 € per sample

Questions? We're happy to help.

Questions? We're happy to help.

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Results in four easy steps

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1
Select the tests you need
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2
Get an order confirmation
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3
Ship your samples to us
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4
Receive your test report