AFM surface roughness measurement

In this analysis, the surface roughness value (RMS) of the sample is determined with atomic force microscopy (AFM). The price includes three measurement points from the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise. In addition to the RMS value, a 2D image, a 3D image, and raw data will be included in the test report.

SemiconductorsMicroscopySurface testing

Suitable sample matrices

Smooth, hard surfaces, such as silicon wafers or glass.

Minimum sample amount

1 x 1 cm

Typical turnaround time

4 weeks after receiving the samples

Detection limit

0.1 nm

Quality system

Measurlabs validated method

Device families

AFM

Method expert

Kia Bertula