AFM surface roughness measurement
In this analysis, the surface roughness value (RMS) of the sample is determined with atomic force microscopy (AFM).
The price includes three measurement points from the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise.
In addition to the RMS value, a 2D image, a 3D image, and raw data will be included in the test report.
More information about the method family:
Atomic Force Microscopy (AFM)- Suitable sample matrices
- Smooth, hard surfaces, such as silicon wafers or glass.
- Minimum sample amount
- 1 x 1 cm
- Typical turnaround time
- 4 weeks after receiving the samples
- Detection limit
- 0.1 nm
- Quality system
- Measurlabs validated method
- Device types
- Method expert
![Hande Günes]()
Hande Günes
Semiconductors
Microscopy
Surface testingQuestions? We're happy to help.
Questions? We're happy to help.
Results in four easy steps
1
Select the tests you need
2
Get an order confirmation
3
Ship your samples to us
4
Receive your test report