AFM surface roughness measurement

In this analysis, the surface roughness value (RMS) of the sample is determined with atomic force microscopy (AFM).

The price includes three measurement points from the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise.

In addition to the RMS value, a 2D image, a 3D image, and raw data will be included in the test report.

Suitable sample matrices
Smooth, hard surfaces, such as silicon wafers or glass.
Minimum sample amount
1 x 1 cm
Typical turnaround time
4 weeks after receiving the samples
Detection limit
0.1 nm
Quality system
Measurlabs validated method
Device types
Method expert
Hande Günes

Order this test online

First sample (VAT 0):
598 €
Additional samples (VAT 0):
476 €per sample
If you have a large number of samples, contact us for a possible discount.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Questions? We're happy to help.

Questions? We're happy to help.

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