Atomic force microscopy
Atomic force microscopy (AFM) is used to analyze the surface topography of smooth surfaces. AFM produces high-resolution 3D images that can be used in roughness analysis. The technique has applications in multiple fields, including physics, molecular engineering, and medicine.
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What is AFM analysis used for?
Atomic force microscopy is commonly used for surface roughness measurement during the development of thin films, semiconductors, and coatings. Its vertical resolution can reach a sub-angstrom (0.1 nm) level, making AFM an excellent tool for analyzing tiny height differences on smooth, hard samples. It can also be used for powder characterization.
Measurlabs frequently provides AFM measurements for several large clients in the semiconductor industry. One of these is Okmetic, the world's seventh largest silicon wafer manufacturer. Read more about our cooperation here:
How does atomic force microscopy work?
During AFM analysis, a probe with a sharp tip attached to a cantilever scans over the sample surface. The tip is controlled by a feedback loop to maintain a constant interaction parameter, which can be either force, amplitude, or frequency, depending on the mode used.
As the tip scans over the surface, vertical displacements of the cantilever are recorded to construct a detailed topographical map. A laser beam is focused onto the back of the cantilever, and its reflection is detected by a position-sensitive photodiode (PSPD). The changes in the laser reflection provide precise information about the cantilever's movements, enabling accurate tracking of the surface topography.
Advantages
High resolution: AFM is capable of sub-nanometer vertical resolution, which is essential for detailed surface analysis.
Versatility: AFM can analyze non-conductive samples without special coatings and operate in various environments, including air, liquid, and vacuum.
Three modes: AFM offers contact, tapping, and non-contact modes to accommodate different sample types and conditions:
Contact mode: Ideal for high-resolution imaging of hard, smooth surfaces.
Tapping mode: Suitable for delicate samples that may be damaged in contact mode.
Non-contact mode: Non-invasive and suitable for soft or loosely bound materials.
Limitations
Surface irregularity: AFM is not suited for highly irregular surfaces.
Scan speed: High-resolution scans of larger areas are time-consuming compared to methods like scanning electron microscopy (SEM).
Size limitation: Profilometry offers faster, though less detailed, surface measurements over larger areas.
Suitable sample matrices
- Thin films
- Ceramics
- Glass
- Metals
- Polymers
- Powders
- Biological samples
- Nanomaterials
Ideal uses of AFM
- Semiconductors and thin films: Assessing thin film uniformity and thickness; identifying surface roughness and defects on silicon wafers
- Metals and alloys: Examining surface roughness, grain boundaries, and defects
- Polymers and ceramics: Studying surface morphology, mechanical properties, and defects
- Nanoparticles and pharmaceuticals: Measuring the size, shape, and surface properties of particles and powders
- Environmental science: Morphology and surface properties of airborne particulate matter, soil, and sediments
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Frequently asked questions
AFM analysis is used to determine the topography of smooth surfaces like those of thin films and wafers. It can produce 3D images of surface profiles and surface roughness values.
AFM contact mode may harm some sample matrices because the tip is in direct contact with the sample.
AFM is suitable for a wide range of surfaces, including polymers, ceramics, composites, glass, and some biological samples.
Measurlabs offers a variety of laboratory analyses for product developers and quality managers. We perform some of the analyses in our own lab, but mostly we outsource them to carefully selected partner laboratories. This way we can send each sample to the lab that is best suited for the purpose, and offer high-quality analyses with more than a thousand different methods to our clients.
When you contact us through our contact form or by email, one of our specialists will take ownership of your case and answer your query. You get an offer with all the necessary details about the analysis, and can send your samples to the indicated address. We will then take care of sending your samples to the correct laboratories and write a clear report on the results for you.
Samples are usually delivered to our laboratory via courier. Contact us for further details before sending samples.