Laboratory testing services

Here are some examples of our most popular testing services. You can filter the options by industry or material, testing type, and device. Please contact us if you can't find the tests you are looking for.

SEM imaging

In SEM imaging, several images with varying magnifications are taken to get a good representative view of the sample surface. The resolution is higher than in traditional microscopy.

SEM-EDX imaging of surfaces

Imaging of the sample using a scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX or EDS). In a typical measurement, several images are taken with varying magnifications to get a good overall view of the sample surface.

AFM surface roughness measurement

In this analysis, the surface roughness value (RMS) of the sample is determined with atomic force microscopy (AFM). The price includes three measurement points from the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise. In …

Particles size and shape analysis with image analyzer

Particle size distribution (PSD) and shapes of the particles are determined using image analysis. The method is suitable for particles sized 10-3000 µm. Image analysis characterizes particle shapes, such as fibers, rods, …

Cross-sectional high resolution TEM-EDX imaging + FIB preparation

Cross-sectional high-resolution TEM-EDX with focused ion beam (FIB) preparation is a powerful combination of sample preparation and imaging techniques. A cross-section of the sample is prepared with a …

Cross-sectional high-resolution TEM imaging + FIB preparation

The sample cross-section is prepared with a focused ion beam (FIB) and then imaged with a high-resolution transmission electron microscope (HR-TEM). The resulting image resolution is very high, …

TEM imaging

Imaging of the sample with transmission electron microscope (TEM). In typical measurement, several images with varying magnifications are taken to get a good overall view of the sample.

Cross-section SEM imaging + Broad Ion Beam (BIB) preparation

The analysis includes the preparation of a cross-section sample using Broad Ion Beam (BIB). After preparation, the cross-section surface is imaged with a Scanning Electron Microscope (SEM).

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AFM surface imaging

During this analysis, the surface of a smooth and hard sample is imaged with an atomic force microscope (AFM). Topological images are provided from several locations around the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise.

TEM-EDX imaging

Imaging of the sample with transmission electron microscopy (TEM) and determination of the elemental composition of the sample using electron dispersive X-ray spectroscopy (EDX or EDS). Several images with varying magnifications are taken to get a good overall view of the …

Cross-section SEM imaging + Focused Ion Beam (FIB) preparation

The analysis includes the preparation of a cross-section sample using a Focused Ion Beam (FIB) and the imaging of the cross-section surface with a Scanning Electron Microscope (SEM).

Cross-section SEM imaging + freeze fracturing preparation

A cross-section sample is prepared using freeze fracturing: the sample is frozen in liquid nitrogen (-195 C°), followed by cracking. The cracked surface is then imaged with a scanning electron microscope (SEM). …

Optical microscopy

Imaging of the sample using optical microscopy. In a typical measurement, several images with varying magnifications are taken to get a good overall view of the sample.

Cross-section SEM-EDX imaging + Broad Ion Beam (BIB) preparation

The analysis includes the preparation of a cross-section sample using Broad Ion Beam (BIB). After preparation, the cross-section is imaged with a scanning electron microscope (SEM), and elemental …

SEM screening of surfaces

In this analysis, a large area of a sample is screened with a scanning electron microscope (SEM) to find an area of interest containing cracks or impurities. Such areas are likely to be found in a few locations around the sample and might be challenging to …

Broad Ion Beam (BIB) cut

Preparation of a cross-section sample using Broad Ion Beam (BIB).

Length Weighted Geometric Mean Diameter (LWGMD) analysis

Determination of Length Weighted Geometric Mean Diameter (LWGMD) using an SEM-based method adapted from EU Commission Regulation (EC) No 761/2009. The price includes the pressing of the sample at 10 MPa. A test …

Volume specific surface area (VSSA) of powders

Determination of volume-specific surface area (VSSA) for the identification of nanoparticles. VSSA can be calculated from the specific surface area obtained by N2 adsorption and the BET method and effective density obtained by He …

Inhalable and respirable dust in indoor air by EN 481:1993 and ISO 7708:1995.

Determination of inhalable and respirable dust fractions present in indoor air. The aerodynamic diameters of the inhalable and respirable dust particles are < 100 µm and < 4 µm, …

Inhalable dust in indoor air

This test is performed to determine the amount of inhalable dust present in indoor air. The sample is collected using a sample collector and pump, which are sent to the customer upon ordering at no extra cost. Inhalable dust particles have an aerodynamic …

Respirable dust in indoor air

The amount of respirable dust in indoor air is measured using SEM and a precision scale. The sample is collected using a sample collector and pump, which are sent to the customer for sampling. The aerodynamic diameter of respirable dust particles is < 4 …

MicroCT scan (X-ray computed tomography)

Nondestructive 3D analysis of internal structures by X-ray computed tomography. The method visualizes voids, cracks, density, and phase differences within solid structures. The method is most suitable for powdered materials. The resolution …

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