TEM imaging
Imaging of the sample with transmission electron microscope (TEM).
Typically, several images with varying magnifications are taken to get a good overview of the sample. TEM allows nm-resolution images.
Solid samples often require FIB preparation, which is not included in the price.
HR-TEM can also be provided. Contact us for more details.
More information about the method:
Focused ion beam (FIB)Cross-sectional TEM analysisTEM analysis (TEM)- Suitable sample matrices
- Dry, solid materials, powder, thin films and coating.
- Required sample quantity
- 1x1 cm or a few milligrams
- Typical turnaround time
- 3 weeks after receiving the samples
- Detection limit
- - nm
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
Chemicals
Cosmetics
Medical devices
Metals and mining
Pharmaceuticals
Semiconductors
Microscopy
Surface testingPrice
Price per sample (Excl. VAT):
850 €
We also charge a 97 € service fee per order.
Large batches of samples are eligible for discounts.
Questions? We're happy to help.
Questions? We're happy to help.
Ask for an offer
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Have questions or need help? Email us at info@measurlabs.com or call +358 50 336 6128.