Inhalable and respirable dust in indoor air by EN 481 & ISO 7708

The particle size distribution (PSD) and shapes of the particles are determined using image analysis. The method is suitable for particles sized 10 to 3,000 µm. Image analysis characterizes particle shapes, such as fibers, rods, and crystals, that cannot be analyzed meaningfully with traditional devices, such as laser diffraction or dynamic light scattering. Depending on the particle shapes, results typically include size distribution for length, width, and equivalent circular area (ECA) diameter.

The following analyses are included in this nanoparticle analysis package, intended to characterize nanoforms according to the REACH Regulation. Particle size distribution and aspect ratios by SEM-EDX Preparation with isopropanol, Sample dispersion on a slide, with centrifugation, SEM analysis and particle count by image analysis, Nanoparticle detection and classification according to the 2022 EC recommendation on the definition of nanomaterial, Reporting of PSD parameters for ~300 particles, including the following: PSD diagram, accumulated and individual., Feret min (min, d10, d25, d50, d75, d90, d95, max), Feret max (min, d10, d25, d50, d75, d90, d95, max), Equivalent circular diameter (min, d10, d25, d50, d75, d90, d95, max), Aspect ratio (calculated based on individual Feret min and Feret max measurements), Number based nano-fraction (%).. Crystal phase analysis by XRD/Rietveld method Sample preparation: drying, grinding, X-ray preparation, XRD analysis over an angular range extending from 10° to 90°, Identification of the crystalline phases present in the sample, Semi-quantitative analysis of phase distribution, using the Rietveld method, Interpretation of diffractograms. Chemical composition/purity by ICP-AES and CHNS analysis ICP-AES quantification of inorganic and metallic elements: Ag, Al, As, B, Ba, Be, Bi, Ca, Cd, Co, Cr, Cu, Fe, K, Li, Mg, Mn, Mo, Na, Ni, P, Pb, S, Se, Sb, Si, Sn, Sr, V, Zn, Ti, and Tl, Determination of C, H, N, and S with an elemental analyzer. Volume-specific surface area (VSSA) and VSSA diameter calculations (optional) BET specific surface area measurement of powder by nitrogen adsorption, True (skeletal) density measurement by He pycnometry, excluding intergranular and intragranular porosity, Both analyses include sample preparation. You can request a quote for the analysis using the form below. Please note that the OECD 125 guideline does not apply to this analysis.

Particle size distribution (PSD) is determined from transmission electron microscopy (TEM) images. The method is most suitable for small particles of 50 nm or smaller. Depending on particle shapes, the method includes calculating the diameters or lengths and widths of particles. In addition to size, TEM provides qualitative information about the surface morphology of the particles. TEM is a good option for irregularly shaped and non-spherical particles such as fibers, rods, and crystals that cannot be characterized meaningfully with traditional methods, including laser diffraction (LD) and dynamic light scattering (DLS). As a result of the analysis, TEM images and the determined particle size distribution for diameter (or length and width) are delivered. Dry samples are suitable for TEM as is. If the particles are wet or dispersed in a solvent, the sample may be dried with a suitable sample preparation method before imaging.

Imaging of the sample using scanning electron microscopy (SEM). Typically, several images are taken with varying magnifications to get a good overview of the sample. Non-conductive samples can be prepared with a metallic coating to allow imaging. For cross-section measurement, additional preparation might be needed: FIB, BIB or freeze fracturing. If compositional analysis is also needed, please see the SEM-EDX measurement.

Determination of volume-specific surface area (VSSA) for the identification of nanoparticles. VSSA can be calculated from the specific surface area obtained by N2 adsorption and the BET method, and the effective density obtained by He Pycnometry. The measurement is a part of the EC recommendation for the definition of nanomaterials (2022/C229/01). According to the recommendation, materials with a VSSA of < 6 m2/cm3 are not considered nanomaterials.

Imaging of the sample using a scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX or EDS). Typically, several images are taken with varying magnifications to get a good overview of the sample. An EDX mapping, line scan, or point measurement is collected to measure the sample composition (elemental at.% or wt.%). Non-conductive samples can be prepared with a metallic coating. For cross-section measurement, additional preparation might be needed: FIB, BIB, or freeze fracturing.

During this analysis, the surface of a smooth and hard sample is imaged with an atomic force microscope (AFM). Topological images are typically provided from three locations around the sample. The measurement area is 5 x 5 micrometers, if not otherwise agreed. Measurements are typically done using the following instrument: Bruker Dimension Icon.

BET (Brunauer–Emmett–Teller) analysis to determine the specific surface area of solid materials.

Determination of microplastics in wastewater using FTIR microspectroscopy. The results of the analysis will specify different types of polymers by size, for example, 10–50 µm, 50–100 µm, 100–500 µm, and >500 µm. This analysis is suitable for natural waters and typical wastewater samples. Please note that both of these matrices need digestion sample preparation due to the possible solid particles in the samples. For special water matrices (process water, industrial water, etc.), please contact the method expert before ordering.

Determination of particle size distribution (PSD) by Laser Diffraction (LD). Analysis can be performed on dispersions or solids that can be dispersed in water or organic solvents. The method can analyze particle sizes from 0.010 µm to 2000 µm. The test report will include a particle size distribution graph, values for volumetric mean = D[4,3], and the following percent finers (percent finers represent the amount of the material from the sample that is smaller than a certain size): Dv(10) / D(v,0.1) / 10 % , Dv(25) / D(v,0.25) / 25 % , Dv(50) / D(v,0.5) / 50 % = median, Dv(75) / D(v,0.75) / 75 % , Dv(90) / D(v,0.9) / 90 %.