X-ray photoelectron spectroscopy (XPS)

XPS is a semi-quantitative technique allowing to measure the elemental composition of the surface of materials. In addition, it can also determine the binding and electronic state of the atoms.

XPS is a surface-sensitive technique. Typical probing depth is 3-10 nm and detection limits roughly 0.1-1 atomic %. XPS can determine elements from Li to U.

The analysis area diameter goes from 10 µm to several 100 µm.

Suitable sample matrices
Dry sample (solid, powder, etc.)
Typical turnaround time
4 weeks after receiving the samples
Detection limit
0.1 - 1 at.%
Quality system
Accredited testing laboratory
Device types
Method expert
Charlotte Zborowski


First sample (VAT 0):
459 €
Additional samples (VAT 0):
341 €per sample

Questions? We're happy to help.

Questions? We're happy to help.

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