X-ray photoelectron spectroscopy (XPS)

XPS is a semi-quantitative technique that allows the measurement of the elemental composition of the surface of materials. In addition, it can also determine the binding and electronic state of the atoms.

XPS is a surface-sensitive technique. Typical probing depth is 3-10 nm, and detection limits roughly 0.1-1 atomic %. XPS can determine elements from Li to U.

For this price, we provide the elemental composition in at.%, measured on an area of a few 100 µm.

Upon request, we can also measure smaller areas or depth profiles, and a binding state determination can be provided.

Contact our expert to request more information.

Suitable sample matrices
Dry sample (solid, powder, etc.)
Required sample quantity
Typical turnaround time
3 weeks after receiving the samples
Detection limit
0.1 - 1 at.%
Available quality systems
Measurlabs validated method
Device types

Questions? We're happy to help.

Questions? We're happy to help.

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