X-ray photoelectron spectroscopy (XPS)
XPS is a semi-quantitative technique allowing to measure the elemental composition of the surface of materials. In addition, it can also determine the binding and electronic state of the atoms.
XPS is a surface-sensitive technique. Typical probing depth is 3-10 nm and detection limits roughly 0.1-1 atomic %. XPS can determine elements from Li to U.
The analysis area diameter goes from 10 µm to several 100 µm.
More information about the method family:X-ray photoelectron spectroscopy (XPS)
- Suitable sample matrices
- Dry sample (solid, powder, etc.)
- Typical turnaround time
- 4 weeks after receiving the samples
- Detection limit
- 0.1 - 1 at.%
- Quality system
- Accredited testing laboratory
- Device types