X-ray photoelectron spectroscopy
Chemical analysis
Material testing
Spectroscopy
Surface testing
X-ray methodsXPS is a semi-quantitative technique to measure the elemental composition of the surface of a material. In addition, it can also determine the binding states of the elements. Typical analyzing depth is 5-10 nm and detection limits roughly 0.1-1 atomic %. XPS can determine all elements, except hydrogen (H) and He (helium).
More information about the method family:
X-ray photoelectron spectroscopy (XPS) (XPS)- Suitable sample matrices
- Solid
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device families
- Method expert
Questions? We're happy to help.
Questions? We're happy to help.
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