X-ray photoelectron spectroscopy (XPS)
XPS is a semi-quantitative technique that allows the measurement of the elemental composition of the surface of materials. In addition, it can also determine the binding and electronic state of the atoms.
XPS is a surface-sensitive technique. Typical probing depth is 3-10 nm, and detection limits roughly 0.1-1 atomic %. XPS can determine elements from Li to U.
For this price, we provide the elemental composition in at.%, measured on an area of a few 100 µm.
Upon request, we can also measure smaller areas or depth profiles, and a binding state determination can be provided.
Contact our expert to request more information.
More information about the method family:
X-ray photoelectron spectroscopy (XPS)- Suitable sample matrices
- Dry sample (solid, powder, etc.)
- Required sample quantity
- 1x1cm
- Typical turnaround time
- 3 weeks after receiving the samples
- Detection limit
- 0.1 - 1 at.%
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
Chemicals
Paper and board
Polymers and plastics
Semiconductors
Compositional analysis
Surface testingQuestions? We're happy to help.
Questions? We're happy to help.
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Have questions or need help? Email us at info@measurlabs.com or call +358 50 336 6128.