X-ray photoelectron spectroscopy (XPS) depth profile + HR measurement

XPS depth profiling combines a sequence of ion gun etch cycles with XPS analyses that provide a quantitative and semi-quantitative composition (mass-%) of the sample surface and layer thicknesses.

Suitable sample matrices
Thin films, coatings, films
Typical turnaround time
4 weeks after receiving the samples
Quality system
Accredited testing laboratory
Device types
Method expert
Kia Bertula
Kia Bertula

Questions? We're happy to help.

Questions? We're happy to help.

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You can also email us at info@measurlabs.com or call +358 50 336 6128.