X-ray photoelectron spectroscopy (XPS) depth profile + HR measurement
XPS depth profiling combines a sequence of ion gun etch cycles with XPS analyses that provide a quantitative and semi-quantitative composition (mass-%) of the sample surface and layer thicknesses.
More information about the method family:
X-ray photoelectron spectroscopy (XPS)
Chemicals
Semiconductors
Compositional analysis- Suitable sample matrices
- Thin films, coatings, films
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Accredited testing laboratory
- Device types
- Method expert
Questions? We're happy to help.
Questions? We're happy to help.
Results in four easy steps
1
Select the tests you need
2
Get an order confirmation
3
Ship your samples to us
4
Receive your test reportAsk for a quote
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