XPS depth profile + HR measurement
Elemental analysis
Material testing
Product testing
Spectroscopy
Surface testing
X-ray methodsXPS depth profiling combines a sequence of ion gun etch cycles with XPS analyses that provide a quantitative and semi-quantitative composition (mass-%) of the sample surface and layer thicknesses.
More information about the method family:
X-ray photoelectron spectroscopy (XPS) (XPS)- Suitable sample matrices
- Thin films, coatings, films
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device families
- Method expert
Questions? We're happy to help.
Questions? We're happy to help.
Ordering made easy
1.Order one of our testing services or ask for help.
2.Send us your samples.
3.We measure your materials or products.
4.You receive the test report and the results in your email.
Ask for a quote
Contact us below to get a quote for testing services in one business day.
You can also email us at info@measurlabs.com or call us at +358 50 336 6128
We always reply within one business day.