XPS depth profile + HR measurement
XPS depth profiling combines a sequence of ion gun etch cycles with XPS analyses that provide a quantitative and semi-quantitative composition (mass-%) of the sample surface and layer thicknesses.
More information about the method family:X-ray photoelectron spectroscopy (XPS) (XPS)
- Suitable sample matrices
- Thin films, coatings, films
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device families
- Method expert
Ordering made easy
1.Order one of our testing services or ask for help.
2.Send us your samples.
3.We measure your materials or products.
4.You receive the test report and the results in your email.