ToF-ERDA measurement

Tof-ERDA measurement for thin films. Results include elemental composition (atomic-%), total content (1E15 at/cm2), and depth profiles (concentration as a function of depth) of the measured layer.

Suitable sample matrices
Thin films, ALD samples
Minimum sample amount
Sample size: 10 x 10 mm – 15 x 15 mm
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula

Interested in this measurement?

You can order this measurement via online checkout. Just fill in a few details below:

664 €
First sample: 664 €
Additional samples: 533 € per sample

Questions? We're happy to help.

Questions? We're happy to help.

Ringing phone

Results in four easy steps

Person selecting tests on a computer
Select the tests you need
Order confirmation message
Get an order confirmation
Sample shipping package
Ship your samples to us
Person receives an email on his phone
Receive your test report