ToF-ERDA measurement

Tof-ERDA measurement for thin films. Results include elemental composition (atomic-%), total content (1E15 at/cm2), and depth profiles (concentration as a function of depth) of the measured layer.

Suitable sample matrices
Thin films, ALD samples
Minimum sample amount
Sample size: 10x10 mm - 15x15 mm
Typical turnaround time
10 weeks after receiving the samples
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula
Price (VAT 0)
First sample: 537 €
Additional samples: 444 € per sample

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You can order this measurement via online checkout. Just fill in a few details below:

537 €(VAT 0)

Questions? We're happy to help.

Questions? We're happy to help.

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1.Order one of our testing services or ask for help.
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2.Send us your samples.
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3.We measure your materials or products.
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4.You receive the test report and the results in your email.