ToF-ERDA measurement
Tof-ERDA measurement for thin films. Results include elemental composition (atomic-%), total content (1E15 at/cm2), and depth profiles (concentration as a function of depth) of the measured layer.
More information about the method family:
Time of flight elastic recoil detection analysis (ERDA)- Suitable sample matrices
- Thin films, ALD samples
- Minimum sample amount
- Sample size: 10x10 mm - 15x15 mm
- Typical turnaround time
- 10 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device families
- Method expert
- Price (VAT 0)
- First sample: 537 €
Additional samples: 444 € per sample
Interested in this measurement?
You can order this measurement via online checkout. Just fill in a few details below:
Questions? We're happy to help.
Questions? We're happy to help.
Ordering made easy
1.Order one of our testing services or ask for help.
2.Send us your samples.
3.We measure your materials or products.
4.You receive the test report and the results in your email.