LA-ICP-MS of thin film samples (standard elements)
Material testing
Surface testingDetermination of metal concentration on ALD thin films using LA-ICP-MS. Standard analyses includes analysis of following elements: Ca, Cr, Cu, Co, Er, Fe, Ge, Pb, Mn, Mo, Ni, K, Na, Sn, Ti, Ta, Zn, Bi, Au, Sn, V, Sr ja Y. Values will be reported in ppm (μg / g).
More information about the method family:
Laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS) (LA-ICP-MS)- Suitable sample matrices
- Thin film, ALD samples
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device families
- Method expert
- Price (VAT 0)
- First sample: 932 €
Additional samples: 793 € per sample
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1.Order one of our testing services or ask for help.
2.Send us your samples.
3.We measure your materials or products.
4.You receive the test report and the results in your email.