LA-ICP-MS of thin film samples (standard elements)

Determination of metal concentrations on ALD thin films using LA-ICP-MS. The standard analysis package includes the quantification of the following elements: Ca, Cr, Cu, Co, Er, Fe, Ge, Pb, Mn, Mo, Ni, K, Na, Sn, Ti, Ta, Zn, Bi, Au, Sn, V, Sr, and Y. Values will be reported in ppm (μg/g).

Suitable sample matrices
Thin film, ALD samples
Typical turnaround time
4 weeks after receiving the samples
Quality system
Accredited testing laboratory
Device types
Method expert
Kia Bertula

Order this test online

First sample (VAT 0):
1,274 €
Additional samples (VAT 0):
1,137 €per sample
If you have a large number of samples, contact us for a possible discount.

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Questions? We're happy to help.

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