LA-ICP-MS of thin film samples (standard elements)

Determination of metal concentration on ALD thin films using LA-ICP-MS. Standard analyses includes analysis of following elements: Ca, Cr, Cu, Co, Er, Fe, Ge, Pb, Mn, Mo, Ni, K, Na, Sn, Ti, Ta, Zn, Bi, Au, Sn, V, Sr ja Y. Values will be reported in ppm (μg / g).

Suitable sample matrices
Thin film, ALD samples
Typical turnaround time
4 weeks after receiving the samples
Quality system
Measurlabs validated method
Device families
Method expert
Shima Moosakhani
Shima Moosakhani

Interested in this measurement?

You can order this measurement via online checkout. Just fill in a few details below:

1,274 €
First sample: 1,274 €
Additional samples: 1,137 € per sample

Questions? We're happy to help.

Questions? We're happy to help.

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