XPS peak deconvolution - binding state of atoms
XPS is a semi-quantitative technique allowing to measure the elemental composition of the surface of materials. In addition, it can also determine the binding state of the atoms.
If you wish to perform this test, please ask the expert about its feasibility.
- Suitable sample matrices
- Dry solid or powder
- Minimum sample amount
- 1x1cm or 1 tablespoon
- Typical turnaround time
- 3 weeks after receiving the samples
- Detection limit
- 0.1 - 1 at.%
- Quality system
- Measurlabs validated method
- Method expert
![Charlotte Zborowski]()
Charlotte Zborowski
Chemicals
Paper and board
Polymers and plastics
Semiconductors
Compositional analysis
Surface testingQuestions? We're happy to help.
Questions? We're happy to help.
Ask for an offer
Fill in the form, and we'll reply in one business day.
Have questions or need help? Email us at info@measurlabs.com or call +358 50 336 6128.