Time-of-flight secondary ion mass spectrometry (ToF-SIMS)
Time of Flight- Secondary Ion Mass Spectrometry (ToF-SIMS) is an analytical technique that provides information about the surfaces of solid materials. It can be used for elemental and molecular analysis and surface mapping of a wide variety of solid-state sample types. The typical analyzing depth is < 2 nm.
More information about the method family:ToF-SIMS Analysis (TOF-SIMS)
- Suitable sample matrices
- Minimum sample amount
- Required sample size: 1 cm2
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
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- Device types
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