ToF-SIMS measurement

Time of flight - secondary ion mass spectrometry (ToF-SIMS) is an analytical technique that provides information about the extreme surfaces of solid materials.

It can be used for elemental and molecular analysis as well as surface mapping.

It can also be used as a depth profiling method with dual ion beams to check for impurities or dopants.

The typical analyzing depth is < 2 nm.

All elements from hydrogen to uranium can be detected.

The results are qualitative.

Suitable sample matrices
Required sample quantity
Required sample size: 1 cm2
Typical turnaround time
4 weeks after receiving the samples
Detection limit
Down to ppm - ppb
Available quality systems
Measurlabs validated method
Device types

Questions? We're happy to help.

Questions? We're happy to help.

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