Time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Time of Flight- Secondary Ion Mass Spectrometry (ToF-SIMS) is an analytical technique that provides information about the surfaces of solid materials. It can be used for elemental and molecular analysis and surface mapping of a wide variety of solid-state sample types. The typical analyzing depth is < 2 nm.

Suitable sample matrices
Minimum sample amount
Required sample size: 1 cm2
Typical turnaround time
4 weeks after receiving the samples
Quality system
Measurlabs validated method
Device families
Method expert
Shima Moosakhani
Shima Moosakhani

Questions? We're happy to help.

Questions? We're happy to help.

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