Time of flight - secondary ion mass spectrometry (ToF-SIMS) is an analytical technique that provides information about the extreme surfaces of solid materials.
It can be used for elemental and molecular analysis as well as surface mapping.
It can also be used as a depth profiling method with dual ion beams to check for impurities or dopants.
The typical analyzing depth is < 2 nm.
All elements from hydrogen to uranium can be detected.
The results are qualitative.
More information about the method family:ToF-SIMS analysis
- Suitable sample matrices
- Required sample quantity
- Required sample size: 1 cm2
- Typical turnaround time
- 4 weeks after receiving the samples
- Detection limit
- Down to ppm - ppb
- Available quality systems
- Measurlabs validated method
- Device types