Time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Time of Flight- Secondary Ion Mass Spectrometry (ToF-SIMS) is an analytical technique that provides information about the surfaces of solid materials. It can be used for elemental and molecular analysis and surface mapping of a wide variety of solid-state sample types. The typical analyzing depth is < 2 nm.

Surface testing

Suitable sample matrices

Solid

Minimum sample amount

Required sample size: 1 cm²

Typical turnaround time

4 weeks after receiving the samples

Quality system

Accredited testing laboratory

Device types

ToF-SIMS

Method expert

Kia Bertula