Ellipsometry measurement

Ellipsometry is an optical technique that characterizes polarized light reflected from a sample's surface. This ellipsometry measurement is used to characterize thin films and bulk materials. The film can be a single or multi-layer film with a preferred thickness between 1nm and 1000nm (or 1μm).

SemiconductorsSurface testing

Suitable sample matrices

Transparent and semitransparent samples, thin films, semiconductors, dielectrics, polymers, organic coatings, metal layers

Typical turnaround time

2 weeks after receiving the samples

Quality system

Measurlabs validated method

Device types

Ellipsometer

Method expert

Kia Bertula

Price (VAT 0)

First sample: 452 €
Additional samples: 314 € per sample