Ellipsometry measurement
Ellipsometry is an optical technique that characterizes polarized light reflected from a sample's surface. This ellipsometry measurement is used to characterize thin films and bulk materials. The film can be a single or multi-layer film with a preferred thickness between 1nm and 1000nm (or 1μm).
More information about the method family:
Ellipsometry- Suitable sample matrices
- Transparent and semitransparent samples, thin films, semiconductors, dielectrics, polymers, organic coatings, metal layers
- Typical turnaround time
- 2 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device types
- Method expert
- Price (VAT 0)
- First sample: 452 €
Additional samples: 314 € per sample
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Questions? We're happy to help.
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