Ellipsometry measurement

Ellipsometry is an optical technique that characterizes polarized light reflected from a sample's surface. This ellipsometry measurement is used to characterize thin films and bulk materials. The film can be a single or multi-layer film with a preferred thickness between 1nm and 1000nm (or 1μm).

Suitable sample matrices
Transparent and semitransparent samples, thin films, semiconductors, dielectrics, polymers, organic coatings, metal layers
Typical turnaround time
2 weeks after receiving the samples
Quality system
Measurlabs validated method
Device types
Method expert
Kia Bertula
Kia Bertula
Price (VAT 0)
First sample: 452 €
Additional samples: 314 € per sample

Questions? We're happy to help.

Questions? We're happy to help.

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