Ellipsometry measurement

Ellipsometry is an optical technique that characterizes polarized light reflected from a sample's surface.

The thickness or the refractive index of the layer can be measured with this technique.

This ellipsometry measurement is used to characterize thin films or coatings. The sample can be a single or multi-layer film. The thickness that can be measured depends on the analyzed material. Do not hesitate to contact the method expert for more details.

Suitable sample matrices
Transparent and semitransparent samples, thin films, semiconductors, dielectrics, polymers, organic coatings, metallic layers
Typical turnaround time
2 weeks after receiving the samples
Available quality systems
Measurlabs validated method
Device types


Price per sample (Excl. VAT):
340 €

We also charge a 97 € service fee per order.

Large batches of samples are eligible for discounts.

Questions? We're happy to help.

Questions? We're happy to help.

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  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.