Ellipsometry

Spectroscopic ellipsometry (SE) is an optical technique that characterizes polarized light reflection from a sample's surface. SE is used to characterize thin film and bulk materials. Film can be a single or multi-layer film with preferred thickness between 1nm and 1000nm (or 1μm).

Suitable sample matrices
Transparent and semitransparent samples, Thin films, Semiconductors, Dielectrics, Polymers, Organic coatings, Metal layers
Typical turnaround time
2 weeks after receiving the samples
Quality system
Measurlabs validated method
Device families
Method expert
Shima Moosakhani
Shima Moosakhani
Price (VAT 0)
First sample: 452 €
Additional samples: 314 € per sample

Questions? We're happy to help.

Questions? We're happy to help.

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