Ellipsometry measurement
Ellipsometry is an optical technique that characterizes polarized light reflected from a sample's surface.
The thickness or the refractive index of the layer can be measured with this technique.
This ellipsometry measurement is used to characterize thin films or coatings. The sample can be a single or multi-layer film. The thickness that can be measured depends on the analyzed material. Do not hesitate to contact the method expert for more details.
More information about the method:
Ellipsometry- Suitable sample matrices
- Transparent and semitransparent samples, thin films, semiconductors, dielectrics, polymers, organic coatings, metallic layers
- Typical turnaround time
- 2 weeks after receiving the samples
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
Semiconductors
Surface testingPrice
Price per sample (Excl. VAT):
340 €
We also charge a 97 € service fee per order.
Large batches of samples are eligible for discounts.
Questions? We're happy to help.
Questions? We're happy to help.
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