Ellipsometry measurement

Ellipsometry is an optical technique that characterizes polarized light reflected from a sample's surface.

The thickness or the refractive index of the layer can be measured with this technique.

This ellipsometry measurement is used to characterize thin films and bulk materials. The sample can be a single or multi-layer film with a preferred thickness between 1 nm and 1000 nm (or 1μm).

Suitable sample matrices
Transparent and semitransparent samples, thin films, semiconductors, dielectrics, polymers, organic coatings, metal layers
Typical turnaround time
2 weeks after receiving the samples
Quality system
Measurlabs validated method
Device types
Method expert
Charlotte Zborowski


First sample (VAT 0):
452 €
Additional samples (VAT 0):
314 €per sample

Questions? We're happy to help.

Questions? We're happy to help.

Ringing phone

Ask for an offer

Fill in the form, and we'll reply in one business day.

Answering the following questions helps us prepare an offer for you faster:

  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.