Nano scratch test
Nano Scratch Test of thin film samples. Typical measurement includes overview image of the scratch track (surface damage) and determination of critical load values.
- Suitable sample matrices
- Thin films, ALD samples
- Typical turnaround time
- 3 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device types
- Method expert
![Charlotte Zborowski]()
Charlotte Zborowski
Semiconductors
Mechanical testing
Surface testingQuestions? We're happy to help.
Questions? We're happy to help.
Results in four easy steps
1
Select the tests you need
2
Get an order confirmation
3
Ship your samples to us
4
Receive your test report