Nano scratch test
Nano Scratch Test of thin film samples. Typical measurement includes overview image of the scratch track (surface damage) and determination of critical load values.
- Suitable sample matrices
- Thin films, ALD samples
- Typical turnaround time
- 3 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device types
- Method expert
![Charlotte Zborowski]()
Charlotte Zborowski
Semiconductors
Mechanical testing
Surface testingLarge number of samples or specialized needs?
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Questions? We're happy to help.
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