Testing services / Nano scratch test

Nano scratch test

Nano Scratch Test of thin film samples. Typical measurement includes overview image of the scratch track (surface damage) and determination of critical load values.

More information about the method:

Nanoindentation
Suitable sample matrices
Thin films, ALD samples
Typical turnaround time
3 weeks after receiving the samples
Available quality systems
Measurlabs validated method
Device types
Scratch tester
Method expert
Kamal Mundoli
Kamal Mundoli
SemiconductorsSemiconductorsMechanical testingMechanical testingSurface testingSurface testing

Questions? We're happy to help.

Questions? We're happy to help.

Business hours: Mon–Fri 9 AM – 5 PM Finnish time (EST/EEST)

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