Nano scratch test
Nano Scratch Test of thin film samples. Typical measurement includes overview image of the scratch track (surface damage) and determination of critical load values.
- Suitable sample matrices
- Thin films, ALD samples
- Typical turnaround time
- 3 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device types
- Method expert
- Charlotte Zborowski
Large number of samples or specialized needs?
Questions? We're happy to help.
Questions? We're happy to help.
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Have questions or need help? Email us at info@measurlabs.com or call +358 50 336 6128.