XRR + GI-XRD of thin films

Grazing Incidence X-ray diffraction (GI-XRD) measurement of thin films + X-ray reflectometry (XRR) analysis of thin films.

Results include density (g/cm3), thickness (nm), and roughness (nm) values.

For XRR, the thickness should generally be below 100 nm and at least one order of magnitude larger than the roughness. For surface roughness measurements, the thickness should preferably be < 250 nm.

Please note that the suitable thickness of the film depends on the material. If you need more information on the analysis, you can always contact our experts.

Suitable sample matrices
Thin films
Required sample quantity
Optimal size: 5 x 4 cm, minimum: 2 x 2 cm
Typical turnaround time
3 weeks after receiving the samples
Available quality systems
Measurlabs validated method
Device types

Pricing and online order

Price per sample (Excl. VAT):
450 €

We also charge a 97 € service fee per order.

Large batches of samples are eligible for discounts.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Questions? We're happy to help.

Questions? We're happy to help.

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  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.