Laboratory testing services

Phase identification and quantification (Rietveld analysis) of a crystalline powder material using X-ray diffraction (XRD). The analysis can also provide unit cell dimensions. The analysis is only suitable for materials with at least one crystalline phase. The quantification accuracy is roughly 0.1 %, depending on the sample matrix and the phase in question. The available temperature range for XRD measurements is 25-1100 °C and the crystallinity can be studied as a function of temperatures. The measurements can be done under a normal atmosphere, inert gas, or vacuum. Please contact our experts to discuss the available temperature and atmosphere combinations. Please mention which crystalline phases your material contains and which ones are you interested in quantifying when requesting testing. However, the method can be applied to unknown phases as well. Either a tabletop or a synchrotron XRD can be used to perform the measurements.

XRF is a quantitative and qualitative method that can be used to analyze solid and liquid materials. This method is intended for a standard screening of homogeneous materials that do not require special sample preparation, precautions, or have any other special requirements. Wavelength-dispersive XRF (WDXRF) is used to perform the measurements unless energy-dispersive XRF (EDXRF) is specifically requested.

Imaging of the sample using a scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX or EDS). Typically, several images are taken with varying magnifications to get a good overview of the sample. An EDX mapping, line scan, or point measurement is collected to measure the sample composition (elemental at.% or wt.%). Non-conductive samples can be prepared with a metallic coating. For cross-section measurement, additional preparation might be needed: FIB, BIB, or freeze fracturing.

Imaging of the sample using scanning electron microscopy (SEM). Typically, several images are taken with varying magnifications to get a good overview of the sample. Non-conductive samples can be prepared with a metallic coating to allow imaging. For cross-section measurement, additional preparation might be needed: FIB, BIB or freeze fracturing. If compositional analysis is also needed, please see the SEM-EDX measurement.

X-Ray Reflectometry (XRR) analysis is used to measure the density (g/cm3), thickness (nm), and roughness (nm) of thin films. The method is applicable to the characterization of single- or multilayered thin films, as it provides information on the thickness and density of individual layers of the sample material as well as the roughness of the interphases. Greatest accuracy for XRR thickness measurements is generally achieved for samples containing 1-150 nm thick surface layers with under 5 nm RMS roughness. Thicker films and coatings with rougher surfaces can also be characterized, but the accuracy of thickness determination decreases as the thickness and roughness of the film or film stack increase. >150 mm wafers are typically cut to fit the sample holder. Please let us know if you need testing for larger wafers that cannot be cut into pieces. The available temperature range for XRR measurements is 25-1100 °C, and crystallinity can be studied as a function of temperature. The measurements can be performed under a normal atmosphere, inert gas, or vacuum. Measurements are typically performed using one of the following instruments: Rigaku SmartLab, Panalytical X'Pert Pro MRD, Bruker D8 Discover. Please let us know if you have a preference for a specific instrument.

Imaging of the sample with transmission electron microscopy (TEM) and determination of the elemental composition of the sample using electron dispersive X-ray spectroscopy (EDX or EDS). Several images with varying magnifications are taken to get a good overview of the sample. An EDX mapping, line scan, or point measurement is collected to measure the sample composition (elemental at.% or wt.%). For solid samples, the analysis often requires FIB preparation, which is priced separately. HR-TEM can also be provided. Contact us for more details about the analysis options.

Imaging of the sample with transmission electron microscope (TEM). Typically, several images with varying magnifications are taken to get a good overview of the sample. TEM allows nm-resolution images. Solid samples often require FIB preparation before analysis. HR-TEM can also be provided. Contact us for more details.

This metal screening analysis includes the semi-quantitative determination of 70 elements. The method can be used, for example, to determine the background concentrations of metals in environmental samples or to study the elemental distribution of unknown samples. Screening is also often performed to assess which metals should be analyzed by a quantitative method. The measurement is performed using a high-resolution ICP-MS technique (ICP-SFMS), which can identify very low elemental concentrations. A semi-quantitative determination of the following elements is included: Ag, Al, As, Au, B, Ba, Be, Bi, Br, Ca, Cd, Ce, Co, Cr, Cs, Cu, Dy, Er, Eu, Fe, Ga, Gd, Ge, Hf, Hg, Ho, I, Ir, K, La, Lu, Mg, Mn, Mo, Na, Nb, Nd, Ni, Os, P, Pb, Pd, Pr, Pt, Rb, Re, Rh, Ru, S, Sb, Sc, Se, Si, Sm, Sn, Sr, Ta, Tb, Te, Th, Ti, Tl, Tm, U, V, W, Y, Yb, Zn and Zr. However, please note that some elements may not be determinable due to matrix interference. During this semi-quantitative analysis, the instrument is calibrated for about 30 elements and the rest of the analytes are quantified using sensitivity factors for calibrated elements with similar mass and first ionization potential considering isotope abundances. Quantitative analysis is also available at an additional price. During this analysis, all elements are calibrated (excluding halogens and Os). Please ask for an offer for this service.

Tensile tests are the most common way to determine the tensile strength, ductility, and toughness of a material. The tests are performed according to ASTM E8/E8M and ISO 6892-1 standards. The results include data on multiple properties, including tensile strength, yield strength, and modulus of elasticity. Standard samples require a minimum 75 mm length and 5 mm diameter, although smaller samples can be measured upon request. The machining of samples can be included in the analysis. We also offer tensile tests at elevated temperatures.

Qualitative or comparative analysis of crystalline powders using X-ray diffraction (XRD). The analysis is only suitable for materials with at least one crystalline phase.

The measurement provides the content of different xanthates using a 1H NMR measurement. In the analysis, appropriate reference is used to quantify the results. Different degradation products can be analyzed simultaneously. Please get in touch with Measurlabs experts to get more details.

Classic stable isotope analysis of carbon (13C) with isotope-ratio mass spectrometry (IRMS). The results are reported in the unit VPDB, ‰. The analysis is suitable for various sample materials. Please contact the Measurlabs expert for more detailed information on the analysis.

A dilatometer is used to determine the linear thermal expansion of a material as a function of temperature. The temperature range of the measurement is generally between 25 °C and 1,600 °C. There is also an option to perform the test in a cryogenic atmosphere, which ranges from -175 °C to 300 °C. The typical heating rate is 3 °C/min. As a result of the measurement, you will get the coefficient of thermal expansion (CTE) and the absolute change in sample length, both as a function of temperature. The testing can be performed in various atmospheres, including air, argon, CO₂, N₂, and O₂. Please contact us to get a quote. The price will depend on the testing conditions, so please specify them as precisely as possible.

ICP-MS elemental analysis for geological samples (rocks, ore, mining samples) with aqua regia digestion. The analysis includes the following elements: Ag, Al, As, Au, B, Ba, Be, Bi, Ca, Cd, Ce, Co, Cr, Cs, Cu, Fe, Ga, Ge, Hf, Hg, In, K, La, Li, Mg, Mn, Mo, Na, Nb, Ni, P, Pb, Pd, Pt, Rb, Re, S, Sb, Sc, Se, Sn, Sr, Ta, Te, Th, Ti, Tl, U, V, W, Y, Zn and Zr. The following rare earth elements (REE) are also included: Dy, Er, Eu, Gd, Ho, Lu, Nd, Pr, Sm, Tb, Tm, and Yb. Gold determinations by this method are semi-quantitative due to the small sample weight used. The price does not include pretreatment, such as crushing or sieving. Shipping included up to 5 kg total weight, extra cost for larger shipments.

Indentation hardness testing measures a material's ability to resist plastic deformation. We offer 3 different types of tests: Brinell hardness testing (ISO 6506-1), Vickers hardness testing (ISO 6507-1), Rockwell hardness testing (ISO 6508-1). These methods work by pressing a standard-sized test head into the sample and measuring either the size of the indentation or the penetration depth of the indentation tip. Each method is suitable for all types of metals and alloys.

ICP-MS elemental analysis for geological samples (rocks, ore, mining samples) with Four Acid digestion. The analysis includes the following elements: Ag, Al, As, Ba, Be, Bi, Ca, Cd, Ce, Co, Cr, Cs, Cu, Fe, Ga, Ge, Ge, Hf, In, K, La, Li, Mg, Mn, Mo, Na, Nb, Ni, P, Pb, Rb, Re, S, Sb, Sc, Se, Sn, Sr, Ta, Te, Th, Ti, Tl, U, V, W, Y, Zn and Zr The following rare earth elements (REE) are also included: Dy, Er, Eu, Gd, Ho, Lu, Nd, Pr, Sm, Tb, Tm, and Yb Lead (Pb) isotope analysis is available for an extra cost (20 €) The price does not include pretreatment, such as crushing or sieving. Additional logistics costs are billed if the sample weighs more than 5 kg.

Magnetometry provides information on the magnetic properties of the sample material as a function of the magnetic field. A vibrating-sample magnetometer (VSM), also referred to as a Foner magnetometer, is used in the measurement. According to Faraday’s Law of Induction, a changing magnetic field will produce an electric field, which can be measured to obtain information about the magnetic field. Magnetometry is suitable for thin films, bulk materials, liquids, and powders. Some of the properties that VSM can measure include magnetic moment, coercivity, and hysteresis loops. Low-temperature VSM can also be used to confirm the Meissner effect in superconducting thin films, including those developed for quantum computing applications. Projects are priced on a case-by-case basis, with lower per-sample prices for large sample sets. Please contact us for a quote.

Spark-OES is a commonly used method to determine the elemental composition of metals and alloys. The method provides a better alternative to other similar analysis techniques (ICP-OES, ICP-MS, XRF) due to its speed and low detection limits. All metallic elements and some non-metallic elements, such as C, N, and S, can be detected in the ppm range. The method is suitable for solid metal pieces with a minimum size of 1 x 1 cm. Sample preparation is included in the analysis.

Quantitative mineralogical analysis by X-ray powder diffraction (XRD) on bentonite samples to identify and quantify the concentration of occurring minerals. The analysis is performed according to EN 13925. The results of the analysis are expressed as percentages, for example: % of Smectite, % of Quartz, % of Calcite, % of Opal, % of Feldspar. The uncertainty of the measurement is 10–20%.

Auger Electron Spectroscopy (AES) is a surface-sensitive technique (3-9 nm) used for compositional analysis and depth profiling, providing data on the elemental composition in depth. Secondary electron images can also be provided. AES is a very useful technique to measure patterns since it has a beam size that can go down to a few nm.

The Charpy impact test is a standardized test used to measure the impact toughness of a material during fracture. Testing is performed according to the ISO 148-1 standard and can be conducted at temperatures as low as -193 °C. A V-shaped or U-shaped notch is created in the sample, after which a pendulum is used to break it. The test measures how much energy the material absorbs before fracturing, giving insight into the material's ability to withstand sudden impacts.

Creep testing is used to monitor the amount of deformation under a constant load over a set period. It allows us to determine how much a material will deform under a specific load at a given temperature. Stress rupture testing is used to determine the time required for a fracture to occur under constant stress. It provides information on how long a material will last under specific loads and temperatures. Both of these tests are essential in determining the material's load-carrying capacity. The tests are performed according to ISO 204 or ASTM E139 standards at temperatures up to 1,250 °C. There are several testing options under ISO 204 and ASTM E139: Uninterrupted creep tests, where elongation is monitored continuously, Interrupted creep tests, where elongation is measured periodically, Stress rupture tests, where the time to fracture is measured, Verification tests to confirm that the material withstands a given force for a predetermined time without fracturing. Pricing depends on the temperature, load, and test duration. Please contact our experts for a quote.

Tensile tests according to ASTM E21 and ISO 6892-2 are used to determine the mechanical properties of metals and alloys at elevated temperatures. The tests are performed at temperatures up to 1,000 °C. The results include data on multiple properties, including tensile strength, yield strength, and elastic modulus. Please specify the desired testing temperature, strain rates, and the standard you wish the tests to be performed by when requesting a quote. Standard samples should be a minimum of 75 mm in length and 5 mm in diameter, although smaller samples can be tested upon request. The machining of samples can be included in the analysis project. We also offer tensile tests at room temperature.