AFM surface imaging

During this analysis, the surface of a smooth and hard sample is imaged with an atomic force microscope (AFM).

Topological images are typically provided from three locations around the sample. The measurement area is 5 x 5 micrometers, if not otherwise agreed.

Measurements are typically done using the following instrument:

  • Bruker Dimension Icon

Suitable sample matrices
Smooth, hard surfaces, such as silicon wafers or glass.
Required sample quantity
1 x 1 cm
Typical turnaround time
2 – 3 weeks after receiving the samples
Detection limit
0.1 nm
Available quality systems
Measurlabs validated method
Device types

Price

Typical price range (Excl. VAT):
220–349 €per sample

We also charge a 97 € service fee per order.

Large batches of samples are eligible for discounts.

Questions? We're happy to help.

Questions? We're happy to help.

Ringing phone
...and more than 700 other happy clients

Ask for an offer

Fill in the form, and we'll reply in one business day.

Answering the following questions helps us prepare an offer for you faster:

  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call our sales team.