AFM surface imaging
During this analysis, the surface of a smooth and hard sample is imaged with an atomic force microscope (AFM).
Topological images are provided from several locations around the sample. The measurement area is 5 x 5 micrometers, if not agreed otherwise.
More information about the method:
Atomic force microscopy (AFM)- Suitable sample matrices
- Smooth, hard surfaces, such as silicon wafers or glass.
- Required sample quantity
- 1 x 1 cm
- Typical turnaround time
- 2 – 3 weeks after receiving the samples
- Detection limit
- 0.1 nm
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
Semiconductors
Microscopy
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