Testing services / Focused ion beam (FIB) preparation

Focused ion beam (FIB) preparation

The focused ion beam (FIB) technique is used to prepare samples for electron microscopy.

It allows very precise cutting of samples to observe them by TEM or SEM imaging.

We are happy to provide a quote for FIB preparation on its own, as well as FIB-TEM or FIB-SEM analysis.

More information about the method:

Focused ion beam (FIB)
Suitable sample matrices
Dry materials: solid films, solid pieces, thin films
Typical turnaround time
2 – 3 weeks after receiving the samples
Available quality systems
Measurlabs validated method
Device types
FIB
Method expert
Hande Güneş
Hande Güneş
Polymers and plasticsPolymers and plasticsSemiconductorsSemiconductorsMicroscopyMicroscopySurface testingSurface testing

Questions? We're happy to help.

Questions? We're happy to help.

Business hours: Mon–Fri 9 AM – 5 PM Finnish time (EST/EEST)

Ringing phone

Other tests we offer

SEM imaging

Read more

SEM-EDX imaging

Read more

XRR of thin films or coatings

Read more

AFM surface imaging

Read more

X-ray photoelectron spectroscopy (XPS)

Read more

Group delay dispersion (GDD) and group velocity dispersion (GVD)

Read more

TEM-EDX imaging

Read more

Optical profilometry

Read more

TEM imaging

Read more

AFM surface roughness measurement

Read more
...and more than 700 other happy clients

Ask for an offer

Fill in the form, and we'll reply in one business day.

Answering the following questions helps us prepare an offer for you faster:

  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call our sales team.