Focused ion beam (FIB) preparation
The Focused Ion Beam (FIB) technique is used to prepare samples for electron microscopy.
It allows very precise cutting of samples to observe them by TEM or SEM imaging.
The displayed price includes only the FIB preparation, but we are happy to provide a quote for FIB-TEM or FIB-SEM upon request.
More information about the method:
Focused ion beam (FIB)- Suitable sample matrices
- Dry materials: solid films, solid pieces, thin films
- Typical turnaround time
- 2 – 3 weeks after receiving the samples
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
Polymers and plastics
Semiconductors
Microscopy
Surface testingPrice
Price per sample (Excl. VAT):
800 €
We also charge a 97 € service fee per order.
Large batches of samples are eligible for discounts.
Questions? We're happy to help.
Questions? We're happy to help.
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Have questions or need help? Email us at info@measurlabs.com or call our sales team.