AFM surface roughness measurement

In this analysis, the surface roughness value (RMS) of the sample is determined with atomic force microscopy (AFM), typically with the Bruker Dimension Icon as the instrument.

Three measurement points from the sample are included in a typical analysis. The measurement area is 5 x 5 micrometers, if not otherwise agreed.

In addition to the RMS value, a 2D image, a 3D image, and raw data will be included in the test report.

Suitable sample matrices
Smooth, hard surfaces, such as silicon wafers or glass.
Required sample quantity
1 x 1 cm
Typical turnaround time
2 – 3 weeks after receiving the samples
Detection limit
0.1 nm
Available quality systems
Measurlabs validated method
Device types

Price

Typical price range (Excl. VAT):
220–349 €per sample

We also charge a 97 € service fee per order.

Large batches of samples are eligible for discounts.

Questions? We're happy to help.

Questions? We're happy to help.

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