LA-ICP-MS of thin film samples (70 elements)
Determination of metal concentration on ALD thin films using LA-ICP-MS. Measurement includes analysis of following elements: Ag, Al, As, Au, B, Ba, Be, Bi, Br, Ca, Cd, Ce, Co, Cr, Cs, Cu, Dy, Er, Eu Fe, Ga, Gd, Ge, Hf, Hg, Ho, I, In, Ir, K, La, Li, Lu, Mg, Mn, Mo, Na, Nb, Nd, Ni, Os, P, Pb, Pd, Pr, Pt, Rb, Re, Rh, Ru, Sb, Sc, Se, Sm, Sn, Sr, Ta, Tb, Te, Th, Ti, Tl, Tm, U, V, W, Y, Yb, Zn, Zr. Values will be reported in ppm (μg / g).
More information about the method family:Laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS) (LA-ICP-MS)
- Suitable sample matrices
- Thin films, ALD samples
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device families
- Method expert
- Price (VAT 0)
- First sample: 1,052 €
Additional samples: 914 € per sample
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