LA-ICP-MS of thin film samples (70 elements)

Determination of metal concentration on ALD thin films using LA-ICP-MS. Measurement includes analysis of following elements: Ag, Al, As, Au, B, Ba, Be, Bi, Br, Ca, Cd, Ce, Co, Cr, Cs, Cu, Dy, Er, Eu Fe, Ga, Gd, Ge, Hf, Hg, Ho, I, In, Ir, K, La, Li, Lu, Mg, Mn, Mo, Na, Nb, Nd, Ni, Os, P, Pb, Pd, Pr, Pt, Rb, Re, Rh, Ru, Sb, Sc, Se, Sm, Sn, Sr, Ta, Tb, Te, Th, Ti, Tl, Tm, U, V, W, Y, Yb, Zn, Zr. Values will be reported in ppm (μg / g).

Suitable sample matrices
Thin films, ALD samples
Typical turnaround time
4 weeks after receiving the samples
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula
Price (VAT 0)
First sample: 1,052 €
Additional samples: 914 € per sample

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1,052 €(VAT 0)

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