LA-ICP-MS of thin film samples (one element)

Determination of metal concentration on ALD thin films using LA-ICP-MS. Measurement includes analysis of one element. Values will be reported in ppm (μg / g).

Suitable sample matrices
Thin films, ALD samples
Typical turnaround time
3 weeks after receiving the samples
Quality system
Accredited testing laboratory
Device families
Method expert
Shima Moosakhani
Shima Moosakhani

Order this measurement online

First sample: 926 €
Additional samples: 788 € per sample
Payment by invoice

Samples are entered during checkout

Questions? We're happy to help.

Questions? We're happy to help.

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