LA-ICP-MS of thin film samples (one element)

Determination of a metal concentration on an ALD thin film using LA-ICP-MS. The measurement includes the analysis of one element, which is selected upon odering.

Values will be reported in ppm (μg/g).

Suitable sample matrices
Thin films, ALD samples
Typical turnaround time
3 weeks after receiving the samples
Quality system
Accredited testing laboratory
Device types
Method expert
Hande Güneş

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First sample (VAT 0):
926 €
Additional samples (VAT 0):
788 €per sample
If you have a large number of samples, contact us for a possible discount.

Samples are entered during checkout.

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