LA-ICP-MS of thin film samples (1 elements)

Determination of metal concentration on ALD thin films using LA-ICP-MS. Measurement includes analysis of 1 element. Values will be reported in ppm (μg / g).

Suitable sample matrices
Thin films, ALD samples
Typical turnaround time
3 weeks after receiving the samples
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula

Interested in this measurement?

You can order this measurement via online checkout. Just fill in a few details below:

768 €
First sample: 768 €
Additional samples: 631 € per sample

Questions? We're happy to help.

Questions? We're happy to help.

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1.Order one of our testing services or ask for help.
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2.Send us your samples.
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3.We measure your materials or products.
Report inside an envelope
4.You receive the test report and the results in your email.