TEM-EDX imaging
Imaging of the sample with transmission electron microscopy (TEM) and determination of the elemental composition of the sample using electron dispersive X-ray spectroscopy (EDX or EDS).
Several images with varying magnifications are taken to get a good overview of the sample. An EDX mapping, line scan, or point measurement is collected to measure the sample composition (elemental at.% or wt.%).
For solid samples, the analysis often requires FIB preparation, which is not included in the price.
HR-TEM can also be provided. Contact us for more details about the analysis options.
More information about the method:
Focused ion beam (FIB)TEM analysis (TEM)Cross-sectional TEM analysis- Suitable sample matrices
- Dry, solid material, powder, thin film or coating
- Required sample quantity
- 1x1 cm or 1 g
- Typical turnaround time
- 2 – 3 weeks after receiving the samples
- Detection limit
- - nm
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
Chemicals
Metals and mining
Pharmaceuticals
Semiconductors
Microscopy
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