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Testing services / Broad Ion Beam (BIB) cut

Broad Ion Beam (BIB) cut

Preparation of a cross-section sample using Broad Ion Beam (BIB).

Typical turnaround time
2 weeks after receiving the samples
Quality system
Accredited testing laboratory
Method expert
Charlotte Zborowski
Charlotte Zborowski
+358 50 349 9831
MicroscopyMicroscopySurface testingSurface testing

Price

First sample (VAT 0):
475 €
Additional samples (VAT 0):
360 €per sample

Questions? We're happy to help.

Questions? We're happy to help.

Business hours: Mon–Fri 9 AM – 5 PM Finnish time (EST/EEST)

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Other tests we offer

AFM surface imaging

310–425 €
Order online

Cross-section SEM-EDX imaging + Broad Ion Beam (BIB) preparation

1,130–1,250 €
Order online

Cross-section SEM imaging + freeze fracturing preparation

420–550 €
Order online

Particle size distribution with SEM

900–1,000 €
Order online

Cross-section SEM imaging + Focused Ion Beam (FIB) preparation

1,090–1,195 €
Order online

SEM screening of surfaces

520–610 €
Order online

TEM imaging + EDX

1,025–1,145 €
Order online

TEM imaging

875–995 €
Order online

AFM surface roughness measurement

310–425 €
Order online

Cross-section SEM imaging + Broad Ion Beam (BIB) preparation

945–1,050 €
Order online

Ask for an offer

Fill in the form, and we'll reply in one business day.

Answering the following questions helps us prepare an offer for you faster:

  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.