Cross-section SEM-EDX imaging + Broad Ion Beam (BIB) preparation

The analysis includes the preparation of a cross-section sample using Broad Ion Beam (BIB). After preparation, the cross-section is imaged with a scanning electron microscope (SEM), and elemental analysis is done with energy-dispersive X-ray spectroscopy (EDX).

The width of the cross-section is roughly 1 mm.

Suitable sample matrices
Dry, solid samples
Typical turnaround time
4 weeks after receiving the samples
Available quality systems
Accredited testing laboratory
Device types

Pricing and online order

First sample (Excl. VAT):
1,250 €
Additional samples (Excl. VAT):
1,130 €per sample
Large batches of samples are eligible for discounts.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Questions? We're happy to help.

Questions? We're happy to help.

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  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.