Cross-Sectional Analysis by BIB - SEM - EDX

The analysis includes the preparation of a cross-section sample using Broad Ion Beam (BIB) cutting or milling. After preparation, the cross-section surface is imaged with a scanning electron microscope (SEM), and elemental analysis is done with energy-dispersive X-ray spectroscopy (EDX).

The width of the cross-section is roughly 1 mm.

Suitable sample matrices
Dry, solid samples
Typical turnaround time
4 weeks after receiving the samples
Quality system
Accredited testing laboratory
Device types
Method expert
Charlotte Zborowski

Order this test online

First sample (VAT 0):
1,501 €
Additional samples (VAT 0):
1,383 €per sample
If you have a large number of samples, contact us for a possible discount.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Questions? We're happy to help.

Questions? We're happy to help.

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