Cross-Sectional Analysis by BIB - SEM - EDX
The analysis includes the preparation of a cross-section sample using Broad Ion Beam (BIB) cutting or milling. After preparation, the cross-section surface is imaged with a scanning electron microscope (SEM), and elemental analysis is done with energy-dispersive X-ray spectroscopy (EDX).
The width of the cross-section is roughly 1 mm.
More information about the method family:
SEM-EDX Analysis (SEM-EDX)Scanning electron microscopy (SEM)- Suitable sample matrices
- Dry, solid samples
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Accredited testing laboratory
- Device types
- Method expert
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Charlotte Zborowski
Chemicals
Polymers and plastics
Semiconductors
Microscopy
Particle testing
Surface testingQuestions? We're happy to help.
Questions? We're happy to help.
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Select the tests you need
2
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3
Ship your samples to us
4
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