Testing services / Cross-section SEM-EDX imaging + Broad Ion Beam (BIB) preparation

Cross-section SEM-EDX imaging + Broad Ion Beam (BIB) preparation

The analysis includes the preparation of a cross-section sample using Broad Ion Beam (BIB). After preparation, the cross-section is imaged with a scanning electron microscope (SEM), and elemental analysis is done with energy-dispersive X-ray spectroscopy (EDX).

The width of the cross-section is roughly 1 mm.

More information about the method family:

SEM-EDX Analysis (SEM-EDX)Scanning electron microscopy (SEM)
Suitable sample matrices
Dry, solid samples
Typical turnaround time
4 weeks after receiving the samples
Available quality systems
Accredited testing laboratory
Device types
SEMSEM-EDX
Method expert
Charlotte Zborowski
Charlotte Zborowski
ChemicalsChemicalsPolymers and plasticsPolymers and plasticsSemiconductorsSemiconductorsMicroscopyMicroscopyParticle testingParticle testingSurface testingSurface testing

Pricing and online order

First sample (Excl. VAT):
1,250 €
Additional samples (Excl. VAT):
1,130 €per sample
Large batches of samples are eligible for discounts.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Questions? We're happy to help.

Questions? We're happy to help.

Business hours: Mon–Fri 9 AM – 5 PM Finnish time (EST/EEST)

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TEM-EDX imaging

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TEM imaging

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XPS peak deconvolution - binding state of atoms

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Cross-sectional high resolution TEM-EDX imaging + FIB preparation

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1,780–1,900 €
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...and more than 600 other happy clients

Ask for an offer

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Answering the following questions helps us prepare an offer for you faster:

  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.