Cross-section SEM-EDX imaging + Broad Ion Beam (BIB) preparation
The analysis includes the preparation of a cross-section sample using Broad Ion Beam (BIB). After preparation, the cross-section is imaged with a scanning electron microscope (SEM), and elemental analysis is done with energy-dispersive X-ray spectroscopy (EDX).
The width of the cross-section is roughly 1 mm.
More information about the method family:
Scanning electron microscopy (SEM)SEM-EDX Analysis (SEM-EDX)- Suitable sample matrices
- Dry, solid samples
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Accredited testing laboratory
- Device types
- Method expert
![Charlotte Zborowski]()
Charlotte Zborowski
Chemicals
Polymers and plastics
Semiconductors
Microscopy
Particle testing
Surface testingLarge number of samples or specialized needs?
Questions? We're happy to help.
Questions? We're happy to help.
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