Cross-section SEM imaging + Broad Ion Beam (BIB) preparation
The analysis includes the preparation of a cross-section sample using Broad Ion Beam (BIB). After preparation, the cross-section surface is imaged with a Scanning Electron Microscope (SEM).
More information about the method family:
Scanning electron microscopy (SEM)- Suitable sample matrices
- Solid films, solid pieces
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Accredited testing laboratory
- Device types
- Method expert
![Charlotte Zborowski]()
Charlotte Zborowski
Microscopy
Particle testing
Surface testingLarge number of samples or specialized needs?
Questions? We're happy to help.
Questions? We're happy to help.
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Have questions or need help? Email us at info@measurlabs.com or call +358 50 336 6128.