Cross-section SEM with Broad Ion Beam (BIB)
The analysis includes the preparation of a cross-section sample using a Broad Ion Beam (BIB) cutting or milling. After preparation, the cross-section surface is imaged with a Scanning Electron Microscope (SEM).
More information about the method family:
Scanning electron microscopy (SEM)
Microscopy
Particle testing
Surface testing- Suitable sample matrices
- Solid films, solid pieces
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Accredited testing laboratory
- Device types
- Method expert
Questions? We're happy to help.
Questions? We're happy to help.
Results in four easy steps
1
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2
Get an order confirmation
3
Ship your samples to us
4
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