Cross-section SEM with Focused Ion Beam (FIB)

The analysis includes the preparation of a cross-section sample using a Focused Ion Beam (FIB) cutting or milling and the imaging of the cross-section surface with a Scanning Electron Microscope (SEM).

Suitable sample matrices
Solid films, solid pieces, thin films
Typical turnaround time
4 weeks after receiving the samples
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula

Order this test online

First sample (VAT 0):
1,197 €
Additional samples (VAT 0):
1,083 €per sample
If you have a large number of samples, contact us for a possible discount.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Questions? We're happy to help.

Questions? We're happy to help.

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