Cross-section SEM imaging + Focused Ion Beam (FIB) preparation

The analysis includes the preparation of a cross-section sample using a Focused Ion Beam (FIB) and the imaging of the cross-section surface with a Scanning Electron Microscope (SEM).

Suitable sample matrices
Dry material: solid films, solid pieces, thin films
Typical turnaround time
3 weeks after receiving the samples
Quality system
Measurlabs validated method
Device types
Method expert
Charlotte Zborowski

Order this test online

First sample (VAT 0):
1,195 €
Additional samples (VAT 0):
1,090 €per sample
If you have a large number of samples, contact us for a possible discount.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Large number of samples or specialized needs?

Questions? We're happy to help.

Questions? We're happy to help.

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  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.