Cross-section SEM with Focused Ion Beam (FIB)
The analysis includes the preparation of a cross-section sample using a Focused Ion Beam (FIB) cutting or milling and the imaging of the cross-section surface with a Scanning Electron Microscope (SEM).
More information about the method family:
SEM-EDX Analysis (SEM-EDX)Scanning electron microscopy (SEM)Focused Ion Beam (FIB)
Polymers and plastics
Semiconductors
Microscopy
Particle testing
Surface testing- Suitable sample matrices
- Solid films, solid pieces, thin films
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device families
- Method expert
Questions? We're happy to help.
Questions? We're happy to help.
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