Cross-section SEM with Focused Ion Beam (FIB)

The analysis includes the preparation of a cross-section sample using a Focused Ion Beam (FIB) and the imaging of the cross-section surface with a Scanning Electron Microscope (SEM).

Suitable sample matrices
Solid films, solid pieces, thin films
Typical turnaround time
4 weeks after receiving the samples
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula

Order this measurement online

First sample: 1,197 €
Additional samples: 1,083 € per sample
Payment by invoice

Samples are entered during checkout

Questions? We're happy to help.

Questions? We're happy to help.

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