Cross-section SEM imaging + Focused Ion Beam (FIB) preparation
The analysis includes the preparation of a cross-section sample using a Focused Ion Beam (FIB) and the imaging of the cross-section surface with a Scanning Electron Microscope (SEM).
- Suitable sample matrices
- Dry material: solid films, solid pieces, thin films
- Typical turnaround time
- 3 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device types
- Method expert
- Charlotte Zborowski
Large number of samples or specialized needs?
Questions? We're happy to help.
Questions? We're happy to help.
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Have questions or need help? Email us at info@measurlabs.com or call +358 50 336 6128.