Cross-section SEM imaging + freeze fracturing preparation
A cross-section sample is prepared using freeze fracturing: the sample is frozen in liquid nitrogen (-195 C°), followed by cracking.
The cracked surface is then imaged with a scanning electron microscope (SEM). Several images of the sample surface with varying magnifications are taken.
The method is suitable for relatively thin and small samples. Appropriate thickness depends on the hardness of the material and the size of the samples but is typically < 1 mm.
More information about the method family:Scanning electron microscopy (SEM)
- Suitable sample matrices
- Solid films, solid pieces
- Typical turnaround time
- 3 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device types