SEM screening of surfaces

Screening of the larger area of the surface with scanning electron microscope (SEM). This method is suitable for samples, in which you want to try to find something (for example cracks, impurities etc) which are probably in one or a few locations in the samples (might be challenging to find). In a typical measurement, several images with varying magnifications are taken to get a good overall view of the sample surface.

Suitable sample matrices
Dry, solid materials
Minimum sample amount
A few milligrams of the material is enough.
Typical turnaround time
3 weeks after receiving the samples
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula

Interested in this measurement?

You can order this measurement via online checkout. Just fill in a few details below:

586 €
First sample: 586 €
Additional samples: 488 € per sample

Questions? We're happy to help.

Questions? We're happy to help.

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