SEM screening of surfaces
In this analysis, a large area of a sample is screened with a scanning electron microscope (SEM) to find an area of interest containing cracks or impurities. Such areas are likely to be found in a few locations around the sample and might be challenging to identify.
In a typical SEM screening, several images with varying magnifications are taken to get a good overall view of the sample surface.
More information about the method family:Scanning electron microscopy (SEM)
- Suitable sample matrices
- Dry, solid materials
- Required sample quantity
- A few milligrams of the material are enough.
- Typical turnaround time
- 2 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device types