- Fast turnaround times
- Personal service from method experts
- Competitive prices
- Result accuracy guarantee
Ideally, the thin films used in applications such as covering circuit boards are made of only the desired elements and there are no impurities present. To monitor the amount of impurities there are very accurate surface testing techniques, such as SIMS, ToF-ERDA, XRR, XRF, EDX and MALDI-ToF available. Along with the elemental composition at the surface, the composition within the film and in the bulk can be determined, to follow for example concentration of oxygen, or any other element as a function of depth. In this way you get a graphical representation of how the elemental composition changes from the surface to the bulk.
Thin films are films that are less than 100 nm in thickness. Typical thin films are prepared by sputtering or atomic layer deposition (ALD), and require a substrate to support the film. The thickness of thin films can be measured using ellipsometry, XRR or electron microscopy.
Roughness of the thin film coating can be determined visually by using SEM or to get actual numbers, including RMS roughness (or Rq), with AFM. The AFM method is super accurate and gives roughness values for very smooth surfaces such as polished silicon wafers.
What is Measurlabs?
Measurlabs is a lab test provider for product developers and quality controllers that need to buy laboratory measurement services from external partners. In addition to our own lab in Helsinki, Finland, we have a global network of partner labs that enables us to offer over one thousand different testing methods for our customers.
Why choose Measurlabs?
Widest range of testing methods – get all your measurements done in the same place.
Best laboratories – for every test, we have sourced the best lab for that particular method, which means that you get the most accurate results and the best price.
Personal service – get help from method experts if you are unsure about standards, your measurement needs or sample suitability.