LA-ICP-MS of thin film samples (one element)
Determination of a metal concentration on an ALD thin film using LA-ICP-MS. The measurement includes the analysis of one element, which is selected upon odering.
Values will be reported in ppm (μg/g).
More information about the method:
LA-ICP-MS analysis (LA-ICP-MS)- Suitable sample matrices
- Thin films, ALD samples
- Typical turnaround time
- 3 weeks after receiving the samples
- Available quality systems
- Accredited testing laboratory
- Device types
- Method expert
Semiconductors
Elements and ions
Surface testingPrice
Price per sample (Excl. VAT):
788 €
We also charge a 97 € service fee per order.
Large batches of samples are eligible for discounts.
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Questions? We're happy to help.
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