Auger electron spectroscopy (AES)

Auger Electron Spectroscopy (AES) is used to analyze the elemental composition of materials.

AES is a surface-sensitive technique (3-9 nm) which is used for depth profiling, providing analysis of the elemental composition in depth. Secondary electron images can also be provided.

This is a very useful technique to measure patterns since it has a beam size which can go down to a few nm.

Suitable sample matrices
Solid, dry and conductive
Required sample quantity
1x1 cm
Typical turnaround time
2 – 3 weeks after receiving the samples
Detection limit
0.1 - 1 at.%
Available quality systems
Measurlabs validated method
Device types

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