X-ray photoelectron spectroscopy (XPS)
XPS is a semi-quantitative technique used to measure the elemental composition of material surfaces. In addition, it can also determine the binding state of the atoms.
XPS is a surface-sensitive technique. Typical probing depth is 3-9 nm, and detection limits range roughly between 0.1 and 1 atomic %. XPS can measure elements from Li to U.
The elemental composition is reported in at.% and measured on 1 area of a few 100 µm.
Upon request, we can measure smaller areas or depth profiles, and a binding state determination can also be provided.
Measurements are typically performed using one of the following instruments:
PHI Genesis
Thermo Fisher ESCALAB 250Xi
PHI Quantum 2000
Synchrotron XPS is also available.
Contact us for more information and a quote for your project.
More information about the method:
X-ray photoelectron spectroscopy (XPS)- Suitable sample matrices
- Dry sample (solid, powder, etc.)
- Required sample quantity
- 1x1 cm
- Typical turnaround time
- 2 – 3 weeks after receiving the samples
- Detection limit
- 0.1 - 1 at.%
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
Chemicals
Paper and board
Polymers and plastics
Semiconductors
Compositional analysis
Surface testingPrice
We also charge a 97 € service fee per order.
Large batches of samples are eligible for discounts.
Questions? We're happy to help.
Questions? We're happy to help.
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