GI-XRD of thin films
Grazing Incidence X-ray diffraction (GI-XRD) measurement of thin film samples.
More information about the method:
Grazing incidence x-ray diffraction (GIXRD)- Suitable sample matrices
- Thin films, ALD samples
- Required sample quantity
- Optimal size: 5 x 4 cm, minimum: 2 x 2 cm
- Typical turnaround time
- 2 weeks after receiving the samples
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
Semiconductors
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