Crystallographic structure analysis with EBSD

Electron backscatter diffraction (EBSD) is an SEM-based technique used to determine crystalline materials' crystallographic orientation, phase, and grain structures.

The method is typically used for failure analysis and microstructure analysis of metals, ceramics, and alloys.

Sample requirements:

EBSD is suitable for flat, polished crystalline samples, including metals, ceramics, and thin films (50–500 nm). We offer polishing for rough samples. Non-conductive samples may require a conductive coating.