Crystallographic structure analysis with EBSD

Electron backscatter diffraction (EBSD) is an SEM-based technique used to determine crystalline materials' crystallographic orientation, phase, and grain structures.

The method is typically used for failure analysis and microstructure analysis of metals, ceramics, and alloys.

Sample requirements:

EBSD is suitable for flat, polished crystalline samples, including metals, ceramics, and thin films (50–500 nm). We offer polishing for rough samples. Non-conductive samples may require a conductive coating.

Suitable sample matrices
Crystalline materials such as metals, alloys and ceramics
Required sample quantity
1 x 1 mm
Typical turnaround time
2 – 3 weeks after receiving the samples
Available quality systems
Measurlabs validated method
Device types

Questions? We're happy to help.

Questions? We're happy to help.

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