Broad Ion Beam (BIB) preparation
Preparation of a sample using the Broad Ion Beam (BIB) technique.
BIB preparation can be used to smooth surfaces or make good-quality cross-sections to observe samples by SEM.
- Suitable sample matrices
- Dry samples, solids
- Required sample quantity
- 1x1 cm
- Typical turnaround time
- 2 weeks after receiving the samples
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
Microscopy
Surface testingPrice
Price per sample (Excl. VAT):
360 €
We also charge a 97 € service fee per order.
Large batches of samples are eligible for discounts.
Questions? We're happy to help.
Questions? We're happy to help.
Ask for an offer
Fill in the form, and we'll reply in one business day.
Have questions or need help? Email us at info@measurlabs.com or call our sales team.