XPS peak deconvolution - binding state of atoms
XPS is a semi-quantitative technique allowing to measure the elemental composition of the surface of materials. In addition, it can also determine the binding state of the atoms.
If you wish to perform this test, please ask the expert about its feasibility.
- Suitable sample matrices
- Dry solid or powder
- Required sample quantity
- 1x1cm or 1 tablespoon
- Typical turnaround time
- 3 weeks after receiving the samples
- Detection limit
- 0.1 - 1 at.%
- Available quality systems
- Measurlabs validated method
- Method expert
Chemicals
Paper and board
Polymers and plastics
Semiconductors
Compositional analysis
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