ToF-SIMS measurement
Time of flight - secondary ion mass spectrometry (ToF-SIMS) is a highly sensitive analytical technique that is used for elemental and molecular analysis, as well as elemental mapping of solid samples. The technique is primarily used for detailed surface analysis of solid materials, whether organic, inorganic, polymeric, or biological
It can also be used as a depth profiling method with dual ion beams to check for impurities or dopants.
All elements from hydrogen to uranium can be detected with concentrations in the parts-per-billion (ppb) range. Compared to SIMS, ToF-SIMS provides only quantitative results.
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More information about the method:
ToF-SIMS analysis- Suitable sample matrices
- Solids
- Required sample quantity
- Required sample size: 1 cm2
- Typical turnaround time
- 2 – 3 weeks after receiving the samples
- Detection limit
- Down to ppm - ppb
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
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