Mechanical shock testing
The method is intended to determine the compatibility of devices and subassemblies to withstand moderately severe shocks. The testing conditions simulate real-world scenarios where the equipment might encounter sudden, forceful impacts.
This is a destructive test intended for device qualification, carried out in accordance with JESD22-B110B.
Example testing conditions:
Pulse shape: saw-tooth curve
Acceleration: 100G
Duration: 2ms
The device is tested along 3 axes and subjected to one shock in both the positive and negative directions for each axis being tested
Service condition C
- Suitable sample matrices
- Microelectronics, PCBs, subassemblies, electrical equipment, automotive components.
- Available quality systems
- Accredited testing laboratory
- Standard
- Method expert
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