Mechanical shock testing

The method is intended to determine the compatibility of devices and subassemblies to withstand moderately severe shocks. The testing conditions simulate real-world scenarios where the equipment might encounter sudden, forceful impacts.

This is a destructive test intended for device qualification, carried out in accordance with JESD22-B110B.

Example testing conditions:

  • Pulse shape: saw-tooth curve

  • Acceleration: 100G

  • Duration: 2ms

  • The device is tested along 3 axes and subjected to one shock in both the positive and negative directions for each axis being tested

  • Service condition C

Suitable sample matrices
Microelectronics, PCBs, subassemblies, electrical equipment, automotive components.
Available quality systems
Accredited testing laboratory

Questions? We're happy to help.

Questions? We're happy to help.

Ringing phone
...and more than 700 other happy clients

Ask for an offer

Fill in the form, and we'll reply in one business day.

Answering the following questions helps us prepare an offer for you faster:

  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.