Mechanical shock testing

The method is intended to determine the compatibility of devices and subassemblies to withstand moderately severe shocks. The testing conditions simulate real-world scenarios where the equipment might encounter sudden, forceful impacts.

This is a destructive test intended for device qualification, carried out in accordance with JESD22-B110B.

Example testing conditions:

  • Pulse shape: saw-tooth curve

  • Acceleration: 100G

  • Duration: 2ms

  • The device is tested along 3 axes and subjected to one shock in both the positive and negative directions for each axis being tested

  • Service condition C

Suitable sample matrices
Microelectronics, PCBs, subassemblies, electrical equipment, automotive components.
Available quality systems
Accredited testing laboratory

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