Methods / SEM

Scanning electron microscopy

Scanning electron microscopy (SEM) is a precise and fast technique for studying the microscopic structures and topology of a material’s surface. SEM has numerous applications in research and product development, such as imaging the surface morphology of particles and coatings. Because of its flexibility, SEM analysis can be used to solve a range of problems in the production process.

SEM image of pollen
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Some of our SEM services

SEM-EDX imaging

Imaging of the sample using a scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX or EDS). Typically, several images are taken with varying magnifications to get a good overview of the sample. An EDX mapping, line scan, or point measurement is collected to measure the sample composition (elemental at.% or wt.%). Non-conductive samples can be prepared with a metallic coating. For cross-section measurement, additional preparation might be needed: FIB, BIB, or freeze fracturing.
157–609 €
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SEM imaging

Imaging of the sample using scanning electron microscopy (SEM). Typically, several images are taken with varying magnifications to get a good overview of the sample. Non-conductive samples can be prepared with a metallic coating to allow imaging. For cross-section measurement, additional preparation might be needed: FIB, BIB or freeze fracturing. If compositional analysis is also needed, please see the SEM-EDX measurement.
107–609 €
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Particle size distribution analysis according to EC recommendations

EC Commission recommendation 2022/C 229/01
Particle size analysis with scanning electron microscopy (SEM). The analysis is performed in conformity with the 2022 European Commission recommendation on the definition of nanomaterials (2022/C 229/01). At least 300 particles are measured, the minimum Feret diameter is chosen as the dimensional parameter, and the particle size distribution histogram is reported. By default, the following data are reported: Mean, Median (d50), Number-based nano percentage according to 2022/C 229/01 definition . Please indicate if you want any other statistics reported. These projects are priced per population of similar particles. If the qualitative SEM analysis reveals multiple populations, the price needs to be adjusted according to the number of populations to be reported. This method can be used to establish the presence of small particles including nanoparticles according to EFSA novel food guidance (Particle-TR). In this case, the following statistics are also included in the report: mean and median, 10% value of the total particles, % of the particles that are smaller than 500 nm, % of the fraction of small particles that are smaller than 250 nm. For cosmetics applications, the following statistics are provided: mean and median, 10% value of the total particles, Number-based nano percentage according to 2022/C 229/01 definition . This analysis can be coupled with XRD analysis for crystallinity information, or with VSSA analysis for specific surface area information.
1,932–2,562 €
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Particle size distribution with SEM

Particle size distribution (PSD) is determined from scanning electron microscope (SEM) images of around 150 particles. Depending on the particle shapes, the method includes calculations on the diameters or lengths and widths of the particles. In addition to size, SEM provides qualitative information about surface morphology. SEM is a good option for irregularly shaped and non-spherical particles such as fibers, rods, and crystals that cannot be characterized meaningfully with traditional methods, including laser diffraction (LD) and dynamic light scattering (DLS). As a result of the analysis, SEM images and the determined particle size distribution for diameter (or one Feret dimension) are delivered. Samples must be completely dry for SEM. If the particles are wet or dispersed in a solvent, the sample may be dried with a suitable sample preparation method before imaging. Ask the method expert for more information and a price for analyzing your samples.
571–921 €
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Crystallographic structure analysis with EBSD

Electron backscatter diffraction (EBSD) is an SEM-based technique used to determine crystalline materials' crystallographic orientation, phase, and grain structures. The method is typically used for failure analysis and microstructure analysis of metals, ceramics, and alloys. Sample requirements: EBSD is suitable for flat, polished crystalline samples, including metals, ceramics, and thin films (50–500 nm). We offer polishing for rough samples. Non-conductive samples may require a conductive coating.
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Inhalable and respirable dust in indoor air by EN 481 & ISO 7708

Determination of inhalable and respirable dust fractions present in indoor air. The aerodynamic diameters of the inhalable and respirable dust particles are < 100 µm and < 4 µm, respectively. The price includes a sample collector and a sample pump, which are delivered to the customer for sampling. Results are reported as mg/m3. According to the Finnish Ministry of Social Affairs and Health's decree on Hazardous Concentrations (538/2018), the normative threshold value for inhalable dust is 10 mg/m3 on an eight-hour average concentration.
346 €
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Prices excluding VAT.

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What is SEM analysis used for?

With SEM, the detailed surface structures of the sample can be seen with high accuracy, which means that a precise image of its surface morphology and even topography can be obtained. Some scanning electron microscopes can have a resolution of less than 1 nm, although a resolution of around 1 to 20 nm is more common.

SEM imaging can be used to identify product defects and imperfections in various types of dry solid materials, including thin films, coatings, and construction materials. SEM may also be used to analyze powders and other particulate matter and can provide the particle size distribution of non-spherical particles, like rods and fibers, that are tricky to analyze with conventional methods.

How does scanning electron microscopy work?

In SEM, a beam of electrons systematically wipes the sample's surface. Electrons are accelerated from a source of electrons and directed through multiple electromagnetic lenses and apertures before hitting the sample. The electrons interact with the surface of the sample and produce different signals when they deviate from their original direction. After the interaction has happened, an electron detector detects the electrons, and the information is turned into a picture by a computer connected to the detector.

SEM-polymer-spheres-and-fibers
SEM image of polymer self-assembled as spheres and fibers.

Additional detectors

There are many different SEM setups, additional detectors, and techniques available for different demands. SEM can be combined with EDX (energy-dispersive X-ray spectroscopy) to perform SEM-EDX analysis. With this method combination, it is possible to determine the elemental composition of the sample in addition to its surface structures. Another possible addition is the electron backscatter diffraction (EBSD) detector, which can be used to visualize the microstructure of crystalline samples.

Suitable samples

Samples used in SEM must be dry, and their surfaces must conduct electricity. If this is not the case (for example, with biological samples), they must be pretreated before SEM. Usually, samples that do not conduct electricity must be coated with a conducting material. Suitable coatings include platinum, gold, palladium, and carbon.

SEM vs. traditional microscopy

The resolution of a picture taken with a microscope - that is, the shortest possible distance between two different targets with which the targets can still be distinguished from each other - depends on the wavelength of the electromagnetic radiation (for example light).

Because electrons have a shorter wavelength than photons, electrons can be used instead of light to get a higher resolution. Therefore, the smallest details of the sample can be seen more closely with an electron microscope than with a traditional optical microscope. If an even higher resolution is needed, transmission electron microscopy (TEM) may be used. You can read more about the differences between SEM and TEM in this article.

Need an analysis?

Measurlabs offers laboratory testing with SEM for various industries and analytical purposes. Some popular applications include failure analysis of semiconductors and determining whether food products contain nanoparticles, but these are just examples. From tens to hundreds of samples, we ensure your analyses are handled on time, with the highest quality. Contact us through the form below to get a custom quote for your specific need and number of samples.

Suitable sample matrices

  • Solid samples
  • Powders
  • Metals
  • Polymers

Ideal uses of SEM

  • Product development and quality control, for example failure analyses
  • Material examination, for instance observation and measurement of the tiny detailed structures of the material’s surface and analysis of its breaking mechanisms
  • Study of complex environmental and biological samples to find out the microscopic structures of their surfaces

Ask for an offer

Fill in the form, and we'll reply in one business day.

Answering the following questions helps us prepare an offer for you faster:

  • How many samples do you have and what is the sample material?

  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

  • Would the sample require cross-sectioning before the imaging? If so, could you provide a detailed explanation and/or a scheme for the cross-sectioning instructions?

  • What is the objective of the imaging? (particle size, morphology information, compositional analysis, etc.)

  • Is the sample dry or can it be dried easily?

Have questions or need help? Email us at or call our sales team.

Frequently asked questions

What is SEM analysis commonly used for?

Scanning electron microscopy is commonly used to screen solid surfaces for cracks or impurities, detect nanoparticles in food samples, and analyze the thickness of semiconductive thin films. SEM can also be used for particle size distribution analysis, where its advantage is the ability to detect particle shape as well as size.

What is SEM-EDX?

In the SEM-EDX method, an EDX detector (also called EDS) is connected to a standard SEM machine. SEM-EDX can be used for identifying elements and determining their distribution and concentrations in the sample. When electrons interact with the surface of the sample, they make the sample produce X-rays which can be detected with an EDX detector. Because every element has its own kind of X-ray spectrum, the elements and compounds in the sample along with their concentrations can be discovered with SEM-EDX. 

In addition to EDX, an X-ray detector (XRF) can identify elements even to the nearest micrometer based on their X-ray spectra when used together with SEM.

What are the limitations of SEM analysis?

With SEM, only the surface structures of the sample can be examined. Even though cross-sectioning of the sample can be used to see the inner structures, this method is not an option if the sample and its inner parts are to be kept in one piece and undamaged. In such cases, non-destructive alternatives like micro-CT imaging may be preferable.

If the sample is too large for the microscope, it may need to be cut before the analysis. This is often done using focused ion beam technology. Other sample preparation techniques are usually needed if the sample is dirty, wet, or does not conduct electricity.

The elements present on the surface of the sample cannot be identified with SEM alone. Instead, SEM-EDX and XRF are suitable methods for this purpose.

What kinds of samples can be analyzed with SEM?

Solid samples are suitable for SEM analysis. Samples must be dry and their surfaces electricity-conducting for most SEM techniques to work. If the sample does not meet these requirements, it must be pretreated before imaging.

What is Measurlabs?

Measurlabs offers a variety of laboratory analyses for product developers and quality managers. We perform some of the analyses in our own lab, but mostly we outsource them to carefully selected partner laboratories. This way we can send each sample to the lab that is best suited for the purpose, and offer high-quality analyses with more than a thousand different methods to our clients.

How does the service work?

When you contact us through our contact form or by email, one of our specialists will take ownership of your case and answer your query. You get an offer with all the necessary details about the analysis, and can send your samples to the indicated address. We will then take care of sending your samples to the correct laboratories and write a clear report on the results for you.

How do I send my samples?

Samples are usually delivered to our laboratory via courier. Contact us for further details before sending samples.