Xanthate content analysis

This metal screening analysis includes the semi-quantitative determination of 70 elements. The method can be used, for example, to determine the background concentrations of metals in environmental samples or to study the elemental distribution of unknown samples. Screening is also often performed to assess which metals should be analyzed by a quantitative method. The measurement is performed using a high-resolution ICP-MS technique (ICP-SFMS), which can identify very low elemental concentrations. A semi-quantitative determination of the following elements is included: Ag, Al, As, Au, B, Ba, Be, Bi, Br, Ca, Cd, Ce, Co, Cr, Cs, Cu, Dy, Er, Eu, Fe, Ga, Gd, Ge, Hf, Hg, Ho, I, Ir, K, La, Lu, Mg, Mn, Mo, Na, Nb, Nd, Ni, Os, P, Pb, Pd, Pr, Pt, Rb, Re, Rh, Ru, S, Sb, Sc, Se, Si, Sm, Sn, Sr, Ta, Tb, Te, Th, Ti, Tl, Tm, U, V, W, Y, Yb, Zn and Zr. However, please note that some elements may not be determinable due to matrix interference. During this semi-quantitative analysis, the instrument is calibrated for about 30 elements and the rest of the analytes are quantified using sensitivity factors for calibrated elements with similar mass and first ionization potential considering isotope abundances. Quantitative analysis is also available at an additional price. During this analysis, all elements are calibrated (excluding halogens and Os). Please ask for an offer for this service.

Phase identification and quantification (Rietveld analysis) of a crystalline powder material using X-ray diffraction (XRD). The analysis can also provide unit cell dimensions. The analysis is only suitable for materials with at least one crystalline phase. The quantification accuracy is roughly 0.1 %, depending on the sample matrix and the phase in question. The available temperature range for XRD measurements is 25-1100 °C and the crystallinity can be studied as a function of temperatures. The measurements can be done under a normal atmosphere, inert gas, or vacuum. Please contact our experts to discuss the available temperature and atmosphere combinations. Please mention which crystalline phases your material contains and which ones are you interested in quantifying when requesting testing. However, the method can be applied to unknown phases as well. Either a tabletop or a synchrotron XRD can be used to perform the measurements.

Auger Electron Spectroscopy (AES) is a surface-sensitive technique (3-9 nm) used for compositional analysis and depth profiling, providing data on the elemental composition in depth. Secondary electron images can also be provided. AES is a very useful technique to measure patterns since it has a beam size that can go down to a few nm.

XRF is a quantitative and qualitative method that can be used to analyze solid and liquid materials. This method is intended for a standard screening of homogeneous materials that do not require special sample preparation, precautions, or have any other special requirements. Wavelength-dispersive XRF (WDXRF) is used to perform the measurements unless energy-dispersive XRF (EDXRF) is specifically requested.

Qualitative or comparative analysis of crystalline powders using X-ray diffraction (XRD). The analysis is only suitable for materials with at least one crystalline phase.

Quantitative mineralogical analysis by X-ray powder diffraction (XRD) on bentonite samples to identify and quantify the concentration of occurring minerals. The analysis is performed according to EN 13925. The results of the analysis are expressed as percentages, for example: % of Smectite, % of Quartz, % of Calcite, % of Opal, % of Feldspar. The uncertainty of the measurement is 10–20%.

Spark-OES is a commonly used method to determine the elemental composition of metals and alloys. The method provides a better alternative to other similar analysis techniques (ICP-OES, ICP-MS, XRF) due to its speed and low detection limits. All metallic elements and some non-metallic elements, such as C, N, and S, can be detected in the ppm range. The method is suitable for solid metal pieces with a minimum size of 1 x 1 cm. Sample preparation is included in the analysis.

Analysis to screen a material for the presence of brominated fire retardants (BFRs), including polybrominated biphenyls (PBBs) and polybrominated diphenyl ethers (PBDEs). The test is performed with a pyrolysis gas-chromatography mass spectrometer (py-GC-MS) according to the ISO 7270-1 standard. The sample is pyrolyzed, which is followed by separation and identification with GC-MS. The obtained pyrogram is then compared to a blank sample that does not contain any brominated fire retardants. We also offer the analysis for electrotechnical products as per IEC 62321-6. Please ask our experts for more information about this option.

Rutherford Backscattering Spectrometry (RBS) can be used to measure the composition of solid samples quantitatively at the surface as well as depth profiling. RBS is used for the analysis of heavy elements and can be combined with ToF-ERDA when lighter elements also need to be analyzed. Elements with similar mass can be difficult to differentiate.

Determination of perfluoroalkyl compounds (PFAS) using the LC-MS technique. We offer several analysis packages that include selected PFAS compounds, and the methods can be applied to many different kinds of chemicals. The list of compounds and the reporting limits can vary depending on the sample matrix, and the suitability of the method has to be verified in advance with Measurlabs. Please contact us through the form below for more details and a quote.