Xanthate content analysis

This metal screening analysis includes the semi-quantitative determination of 70 elements. The method can be used, for example, to determine the background concentrations of metals in environmental samples or to study the elemental distribution of unknown samples. Screening is also often performed to assess which metals should be analyzed by a quantitative method. The measurement is performed using a high-resolution ICP-MS technique (ICP-SFMS), which can identify very low elemental concentrations. A semi-quantitative determination of the following elements is included: Ag, Al, As, Au, B, Ba, Be, Bi, Br, Ca, Cd, Ce, Co, Cr, Cs, Cu, Dy, Er, Eu, Fe, Ga, Gd, Ge, Hf, Hg, Ho, I, Ir, K, La, Lu, Mg, Mn, Mo, Na, Nb, Nd, Ni, Os, P, Pb, Pd, Pr, Pt, Rb, Re, Rh, Ru, S, Sb, Sc, Se, Si, Sm, Sn, Sr, Ta, Tb, Te, Th, Ti, Tl, Tm, U, V, W, Y, Yb, Zn and Zr. However, please note that some elements may not be determinable due to matrix interference. During this semi-quantitative analysis, the instrument is calibrated for about 30 elements and the rest of the analytes are quantified using sensitivity factors for calibrated elements with similar mass and first ionization potential considering isotope abundances. Quantitative analysis is also available at an additional price. During this analysis, all elements are calibrated (excluding halogens and Os). Please ask for an offer for this service.

This analysis provides quantitative information about the crystalline and amorphous phases within your sample using high-resolution synchrotron X-ray diffraction (XRD). A standard analysis includes: Quantification of crystalline phases as weight percentages, Quantification of the total amorphous content, High-resolution powder diffraction data and the resulting diffractogram, A comprehensive test report detailing the findings. For more advanced needs, we also offer total scattering/pair distribution function (PDF) analysis to reveal the local atomic structure in amorphous or nano-structured materials.

Phase identification and quantification (Rietveld analysis) of a crystalline powder material using X-ray diffraction (XRD). The analysis can also provide unit cell dimensions. The analysis is only suitable for materials with at least one crystalline phase. The quantification accuracy is roughly 0.1 %, depending on the sample matrix and the phase in question. The available temperature range for XRD measurements is 25-1100 °C and the crystallinity can be studied as a function of temperatures. The measurements can be done under a normal atmosphere, inert gas, or vacuum. Please contact our experts to discuss the available temperature and atmosphere combinations. Please mention which crystalline phases your material contains and which ones are you interested in quantifying when requesting testing. However, the method can be applied to unknown phases as well. Either a tabletop or a synchrotron XRD can be used to perform the measurements.

Auger Electron Spectroscopy (AES) is a surface-sensitive technique (3-9 nm) used for compositional analysis and depth profiling, providing data on the elemental composition in depth. Secondary electron images can also be provided. AES is a very useful technique to measure patterns since it has a beam size that can go down to a few nm.

XRF is a quantitative and qualitative method that can be used to analyze solid and liquid materials. This method is intended for a standard screening of homogeneous materials that do not require special sample preparation, precautions, or have any other special requirements. Wavelength-dispersive XRF (WDXRF) is used to perform the measurements unless energy-dispersive XRF (EDXRF) is specifically requested.

Qualitative or comparative analysis of crystalline powders using X-ray diffraction (XRD). The analysis is only suitable for materials with at least one crystalline phase.

Spark-OES is a commonly used method to determine the elemental composition of metals and alloys. The method provides a better alternative to other similar analysis techniques (ICP-OES, ICP-MS, XRF) due to its speed and low detection limits. All metallic elements and some non-metallic elements, such as C, N, and S, can be detected in the ppm range. The method is suitable for solid metal pieces with a minimum size of 1 x 1 cm. Sample preparation is included in the analysis.

Rutherford Backscattering Spectrometry (RBS) can be used to measure the composition of solid samples quantitatively at the surface as well as depth profiling. RBS is used for the analysis of heavy elements and can be combined with ToF-ERDA when lighter elements also need to be analyzed. Elements with similar mass can be difficult to differentiate.

Determination of perfluoroalkyl compounds (PFAS) in various types of chemical samples using the LC-MS technique. We offer several analysis packages that contain selected PFAS compounds. For example, the following package can be used for most chemical samples: Abbreviation Compound CAS number PFBA perfluorobutanoic acid 375-22-4 PFPeA perfluoropentanoic acid 2706-90-3 PFHxA perfluorohexanoic acid 307-24-4 PFHpA perfluoroheptanoic acid 375-85-9 PFOA perfluorooctanoic acid 335-67-1 PFNA perfluorononanoic acid 375-95-1 PFDA perfluorodecanoic acid 335-76-2 PFUnA; PFUdA perfluoroundecanoic acid 2058-94-8 PFDoA perfluorododecanoic acid 307-55-1 PFTrDA; PFTriA perfluorotridecanoic acid 72629-94-8 PFTeA perfluorotetradecanoic acid 376-06-7 PFHxDA perfluorohexadecanoic acid 67905-19-5 PFODA perfluorooctadecanoic acid 16517-11-6 PFBS perfluorobutanesulfonic acid 375-73-5 PFPeS perfluoropentanesulfonic acid 2706-91-4 PFHxS perfluorohexanesulfonic acid 355-46-4 PFHpS perfluoroheptanesulfonic acid 375-92-8 PFOS perfluorooctanesulfonic acid 1763-23-1 PFNS Perfluorononanesulfonic acid 68259-12-1 PFDS perfluorodecanesulfonic acid 335-77-3 PFUnDS perfluoroundecanesulfonic acid 749786-16-1 PFDoS perfluorododecanesulfonic acid 79780-39-5 HFPO-DA (Gen X) 2,3,3,3-Tetrafluoro-2-(heptafluoropropoxy)propanoic acid 13252-13-6 HFPO-TA perfluoro-2,5-dimethyl-3,6-dioxanonanoic acid 13252-14-7 DONA; ADONA 4,8-dioxa-3H-perfluorononanoic acid 919005-14-4 PFMOPrA perfluoro-3-methoxypropanoic acid 377-73-1 NFDHA perfluoro-3,6-dioxaheptanoic acid 151772-58-6 PFMOBA perfluoro-4-methoxybutanoic acid 863090-89-5 PFecHS cyclohexanesulfonic acid, 1,2,2,3,3,4,5,5,6,6-decafluoro-4-(1,1,2,2,2-pentafluoroethyl)-, potassium salt (1:1) 335-24-0 3:3 FTCA 2H,2H,3H,3H-perfluorohexanoic acid 356-02-5 5:3 FTCA 2H,2H,3H,3H-perfluorooctanoic acid 914637-49-3 7:3 FTCA 2H,2H,3H,3H-perfluorodecanoic acid 812-70-4 PFEESA perfluoro(2-ethoxyethane)sulfonic acid 113507-82-7 6:2 Cl-PFESA; 9Cl-PF3ONS 9-chlorohexadecafluoro-3-oxanonane-1-sulfonic acid 756426-58-1 8:2 Cl-PFESA; 11Cl-PF3OUdS 11-chloroeicosafluoro-3-oxaundecane-1-sulfonic acid 763051-92-9 4:2 FTSA; 4:2 FTS 4:2 fluorotelomer sulfonic acid 757124-72-4 6:2 FTSA; 6:2 FTS 6:2 fluorotelomer sulfonic acid 27619-97-2 8:2 FTSA; 8:2 FTS 8:2 fluorotelomer sulfonic acid 39108-34-4 FBSA perfluorobutane sulfonamide 30334-69-1 FHxSA perfluorohexanesulfonamide 41997-13-1 FOSA perfluorooctanesulfonamide 754-91-6 MeFOSA; N-MeFOSA n-methylperfluorooctanesulfonamide 31506-32-8 EtFOSA; N-EtFOSA n-ethylperfluorooctanesulfonamide 4151-50-2 MeFOSE n-methylperfluorooctanesulfonamidoethanol 24448-09-7 EtFOSE n-ethylperfluorooctanesulfonamidoethanol 1691-99-2 NMeFOSAA; MeFOSAA n-methylperfluorooctanesulfonamidoacetic acid 2355-31-9 NEtFOSAA; EtFOSAA n-ethylperfluorooctanesulfonamidoacetic acid 2991-50-6 FOSAA perfluorooctane sulfonamidoacetic acid 2806-24-8 10:2 FTS 10:2 Fluorotelomer sulfonic acid 108026-35-3 Target compounds and reporting limits can vary depending on the sample matrix. Typical limits of reporting vary from 1 to 50 ng/L for liquid samples and 1 to 100 μg/kg for solid samples. Contact us with a description of your samples and analysis goals, so that we can confirm method suitability and prepare a quotation.

XPS is a semi-quantitative technique used to measure the elemental composition of material surfaces. In addition, it can also determine the binding state of the atoms. XPS is a surface-sensitive technique. Typical probing depth is 3-9 nm, and detection limits range roughly between 0.1 and 1 atomic %. XPS can measure elements from Li to U. The elemental composition is reported in at.% and measured on 1 area of a few 100 µm. Upon request, we can measure smaller areas or depth profiles, and a binding state determination can also be provided. Measurements are typically performed using one of the following instruments: PHI Genesis, Thermo Fisher ESCALAB 250Xi, PHI Quantum 2000. Synchrotron XPS is also available. Contact us for more information and a quote for your project.