Anupam Glorious Lobo

M.Tech in Polymer Science and Technology

Inorganic Materials

anupam.lobo@measurlabs.com +358 45 856 6336

Anupam Glorious Lobo works at Measurlabs as a Testing Expert in the Inorganic Materials team. He holds a Bachelor's degree in Mechanical Engineering and a Master's degree in Polymer Science and Technology. He is currently a Marie Curie Doctoral Fellow at the University of Oulu, where his research focuses on developing and scaling photocatalytic materials and systems for green hydrogen production.

Before beginning his doctoral studies, Anupam worked on high-performance breath sensors and wearable devices and studied the behavior of polymeric thin and ultrathin films. His work at a sensor technology startup included contributing to the full development cycle of a wearable breath sensor, from initial research through prototyping and product pitch.

Academic publications

Anupam has co-authored several academic publications, including the following:

Tailor made biheterocyclic pyrazoline-thiazolidinones as effective inhibitors of Escherichia coli FabH: Design, synthesis and structural studies in Journal of Molecular Structure
Spectral, morphological and optical studies on bischalcone doped polylactic acid (PLA) thin films as luminescent and UV radiation blocking materials in Optical Materials
Single crystal X-ray studies and Hirshfeld surface analysis of ethoxy phenyl substituted chalcone derivatives in Chemical Data Collections

Anupam’s top testing services

C-AFM measurement

Simultaneous mapping of the local electrical conductivity and surface topography of thin films and other semiconductor materials using conductive atomic force microscopy (C-AFM). A bias voltage is applied between the conductive probe tip and the grounded sample, and the resulting current is recorded pixel by pixel across the scan area, producing co-registered topography and current maps at lateral resolutions of 20–50 nm. At selected points, the bias can be swept to generate local current-voltage (I-V) curves. The current detection range is approximately 1 pA to 10 µA; materials with resistivity above ~10⁹ Ω·cm cannot be reliably characterized. The results are reported as co-registered topography and current maps, resistance maps where applicable, and local I-V curves for selected measurement points.

260–450 €

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