XRF analysis (Si, Al, Ca, Ti, P, Mn, Cr and C) for SiFe samples
X-ray fluorescence measurement for SiFe samples. The analysis includes the determination of the following elements: Si, Al, Ca, Ti, P, Mn, Cr and C. The results of the measured elements are reported in unit %.
More information about the method family:X-ray fluorescence (XRF)
- Suitable sample matrices
- Minimum sample amount
- 50 g
- Typical turnaround time
- 2 weeks after receiving the samples
- Quality system
- Accredited testing laboratory
- Device families
- Method expert
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