XRF analysis (Si, Al, Ca, Ti, P, Mn, Cr and C) of SiFe samples
X-ray fluorescence measurement for SiFe samples. The analysis includes the determination of the following elements: Si, Al, Ca, Ti, P, Mn, Cr and C.
The results of the measured elements are reported in unit %.
More information about the method family:XRF Analysis (XRF)
- Suitable sample matrices
- Required sample quantity
- 50 g
- Typical turnaround time
- 2 weeks after receiving the samples
- Quality system
- Accredited testing laboratory
- Device types