XRF analysis (Si, Al, Ca, Ti, P, Mn, Cr and C) for SiFe samples

X-ray methodsX-ray methods

X-ray fluorescence measurement for SiFe samples. The analysis includes the determination of the following elements: Si, Al, Ca, Ti, P, Mn, Cr and C. The results of the measured elements are reported in unit %.

Suitable sample matrices
Minimum sample amount
50 g
Typical turnaround time
2 weeks after receiving the samples
Quality system
Accredited testing laboratory
Device families
Method expert


First sample


per sample

Additional samples


per sample

Prices excluding VAT.

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1.Order one of our testing services or ask for help.
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2.Send us your samples.
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3.We measure your materials or products.
Report inside an envelope
4.You receive the test report and the results in your email.

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