XRF analysis (Si, Al, Ca, Ti, P, Mn, Cr and C) of SiFe samples
X-ray fluorescence measurement for SiFe samples. The analysis includes the determination of the following elements: Si, Al, Ca, Ti, P, Mn, Cr and C.
The results of the measured elements are reported in unit %.
More information about the method family:
XRF Analysis (XRF)- Suitable sample matrices
- SiFe
- Required sample quantity
- 50 g
- Typical turnaround time
- 2 weeks after receiving the samples
- Quality system
- Accredited testing laboratory
- Device types
- Method expert
- Mirva Hirvi
Large number of samples or specialized needs?
Questions? We're happy to help.
Questions? We're happy to help.
Ask for an offer
Fill in the form, and we'll reply in one business day.
Have questions or need help? Email us at info@measurlabs.com or call +358 50 336 6128.