XRF analysis (Si, Al, Ca, Ti, P, Mn, Cr and C) of SiFe samples

X-ray fluorescence measurement for SiFe samples. The analysis includes the determination of the following elements: Si, Al, Ca, Ti, P, Mn, Cr and C. The results of the measured elements are reported in unit %.

Suitable sample matrices
Minimum sample amount
50 g
Typical turnaround time
2 weeks after receiving the samples
Quality system
Accredited testing laboratory
Device families
Method expert
Mirva Hirvi
Mirva Hirvi

Order this measurement online

First sample: 489 €
Additional samples: 395 € per sample
Payment by invoice

Samples are entered during checkout

Questions? We're happy to help.

Questions? We're happy to help.

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