XRF analysis (Si, Al, Ca, Ti, P, Mn, Cr and C) of SiFe samples
X-ray fluorescence measurement for SiFe samples. The analysis includes the determination of the following elements: Si, Al, Ca, Ti, P, Mn, Cr and C. The results of the measured elements are reported in unit %.
More information about the method family:
XRF Analysis (XRF)
Metals and mining
Compositional analysis
Elements and ions- Suitable sample matrices
- SiFe
- Minimum sample amount
- 50 g
- Typical turnaround time
- 2 weeks after receiving the samples
- Quality system
- Accredited testing laboratory
- Device families
- Method expert
Order this measurement online
Questions? We're happy to help.
Questions? We're happy to help.
Results in four easy steps
1
Select the tests you need
2
Get an order confirmation
3
Ship your samples to us
4
Receive your test report