XRF analysis (Si, Al, Ca, Ti, P, Mn, Cr and C) for SiFe samples
X-ray methodsX-ray fluorescence measurement for SiFe samples. The analysis includes the determination of the following elements: Si, Al, Ca, Ti, P, Mn, Cr and C. The results of the measured elements are reported in unit %.
More information about the method family:
X-ray fluorescence (XRF)- Suitable sample matrices
- SiFe
- Minimum sample amount
- 50 g
- Typical turnaround time
- 2 weeks after receiving the samples
- Quality system
- Accredited testing laboratory
- Device families
- Method expert
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Questions? We're happy to help.
Questions? We're happy to help.
Ordering made easy
1.Order one of our testing services or ask for help.
2.Send us your samples.
3.We measure your materials or products.
4.You receive the test report and the results in your email.