RBS Analysis
Rutherford backscattering spectrometry (RBS) is an ion beam analysis method for determining the elemental composition of thin films. RBS enables quantitative depth profiling up to a depth of 1 µm.
Simple pricing model, no hidden fees
Prices excluding VAT (24 %).
- Fast turnaround times
- Personal service from method experts
- Competitive prices
- Result accuracy guarantee
What is Rutherford backscattering spectrometry used for?
Rutherford backscattering spectrometry (RBS) is an ion beam technique for thin film characterization and studying solid surfaces. The technique gives quantitative information on the different elements present on the surface of the sample and as a function of depth. The maximum profiling depth of RBS is 1 micrometer.
Strength and limitations
+ The main advantage of the RBS technique is its ability to provide depth profiles for multiple elements during one measurement without reference standards.
+ Unlike many other thin film techniques, including SIMS and cross-section SEM-EDX, RBS is a nondestructive method when used for surface analysis.
- RBS is suitable for the analysis of heavy elements on a light substrate, but light elements on a heavy substrate cannot be detected.
How does RBS work?
Typically, RBS uses a high-energy beam of He2+ ions that is directed onto a sample surface. Some of the incoming ions are scattered elastically from the sample's atomic nuclei. These backscattered ions are detected and the energy distributions and yield of ions at a given angle are measured. The detected energy is dependent on the mass of the target nucleus and the depth of the scattering event.
Suitable sample matrices
- Thin films
- Semiconductors
- Optical coatings
- GaN and Si wafers
Ideal uses of RBS analysis
- Determining the thickness of films and coatings
- Analyzing the composition of thin films
- Determining the depth profiles of a sample's surface layers
Ask for an offer
Fill in the form, and we'll reply in one business day.
Have questions or need help? Email us at info@measurlabs.com or call +358 50 336 6128.
Frequently asked questions
RBS is used to analyze the elemental composition of solid surfaces. The technique can give elemental information on the surface of a solid sample down to ~1,000 nm depth.
RBS is not suitable for the analysis of light elements in heavy matrices. The sample must also be vacuum compatible.
Thin films, semiconductors, and coatings are common sample materials for RBS analysis.
Measurlabs offers a variety of laboratory analyses for product developers and quality managers. We perform some of the analyses in our own lab, but mostly we outsource them to carefully selected partner laboratories. This way we can send each sample to the lab that is best suited for the purpose, and offer high-quality analyses with more than a thousand different methods to our clients.
When you contact us through our contact form or by email, one of our specialists will take ownership of your case and answer your query. You get an offer with all the necessary details about the analysis, and can send your samples to the indicated address. We will then take care of sending your samples to the correct laboratories and write a clear report on the results for you.
Samples are usually delivered to our laboratory via courier. Contact us for further details before sending samples.