Solutions / Events & webinars

Events & webinars

Expand your knowledge with our expert-led events around the topics of testing and regulatory compliance. Join our upcoming live webinars to connect with our experts and bring your own questions to the discussion or explore our library of past recordings to learn at your own pace.
Measurlabs events
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Webinar: Techniques for contamination analysis of thin films and wafers

Tuesday April 28, at 2-3 PM (EEST)

Join this expert webinar to learn more about the analytical techniques used for contamination analysis: VPD ICP-MS, TXRF, SIMS, ATD-GC-MS, and others. Our experts will offer insights on how the different techniques work, in what situations they can be applied, and what limitations they have.

During the 1-hour session, you will gain insights at least to the following:

  • How to select the method according to the contamination type (metal, organic, particle...)

  • Bulk vs localized contamination analysis

  • Contamination depth profiling

After the presentation, there will also be time for audience questions. We are hosting the webinar on Zoom to allow asking questions anonymously during the Q&A. To do this, enter a nickname when joining the meeting, but please register with your real name and email to receive the invitation.

Available recordings